Sundar V. PATHY

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Chandler, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Debug tool for test instruments coupled to a device under test
- Patent number 11,598,804
- Issue date Mar 7, 2023
- Intel Corporation
- Jesse Armagost
- G01 - MEASURING TESTING
Information Patent Grant
Compressed test patterns for a field programmable gate array
- Patent number 11,193,975
- Issue date Dec 7, 2021
- Intel Corportion
- Christopher J. Nelson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEBUG TOOL FOR TEST INSTRUMENTS COUPLED TO A DEVICE UNDER TEST
- Publication number 20200300912
- Publication date Sep 24, 2020
- Intel Corporation
- Jesse ARMAGOST
- G01 - MEASURING TESTING
Information Patent Application
COMPRESSED TEST PATTERNS FOR A FIELD PROGRAMMABLE GATE ARRAY
- Publication number 20200003836
- Publication date Jan 2, 2020
- Intel Corporation
- Christopher J. NELSON
- G01 - MEASURING TESTING