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Sundarrajan Subramanian
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Bangalore, IN
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Patents Grants
last 30 patents
Information
Patent Grant
Compressed scan chain diagnosis by internal chain observation, proc...
Patent number
11,921,159
Issue date
Mar 5, 2024
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Compressed scan chain diagnosis by internal chain observation, proc...
Patent number
11,592,483
Issue date
Feb 28, 2023
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Functional circuitry, decompressor circuitry, scan circuitry, maski...
Patent number
11,119,152
Issue date
Sep 14, 2021
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Compressed scan chains with three input mask gates and registers
Patent number
10,591,540
Issue date
Mar 17, 2020
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Compressed scan chains with three input mask gates and registers
Patent number
9,952,283
Issue date
Apr 24, 2018
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Decompressed scan chain masking circuit shift register with log2(n/...
Patent number
9,229,055
Issue date
Jan 5, 2016
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Scan chain masking qualification circuit shift register and bit-fie...
Patent number
9,091,729
Issue date
Jul 28, 2015
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Masking circuit removing unknown bit from cell in scan chain
Patent number
8,887,018
Issue date
Nov 11, 2014
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Structures and control processes for efficient generation of differ...
Patent number
8,438,437
Issue date
May 7, 2013
Texas Instruments Incorporated
Arvind Jain
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROC...
Publication number
20230194605
Publication date
Jun 22, 2023
TEXAS INSTRUMENTS INCORPORATED
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Application
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROC...
Publication number
20210364569
Publication date
Nov 25, 2021
TEXAS INSTRUMENTS INCORPORATED
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Application
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROC...
Publication number
20200174069
Publication date
Jun 4, 2020
TEXAS INSTRUMENTS INCORPORATED
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Application
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROC...
Publication number
20180210030
Publication date
Jul 26, 2018
TEXAS INSTRUMENTS INCORPORATED
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Application
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROC...
Publication number
20160069958
Publication date
Mar 10, 2016
TEXAS INSTRUMENTS INCORPORATED
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Application
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROC...
Publication number
20150285860
Publication date
Oct 8, 2015
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Application
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROC...
Publication number
20150006987
Publication date
Jan 1, 2015
TEXAS INSTRUMENTS INCORPORATED
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURES AND CONTROL PROCESSES FOR EFFICIENT GENERATION OF DIFFER...
Publication number
20120030532
Publication date
Feb 2, 2012
TEXAS INSTRUMENTS INCORPORATED
Arvind Jain
G01 - MEASURING TESTING
Information
Patent Application
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROC...
Publication number
20110307750
Publication date
Dec 15, 2011
TEXAS INSTRUMENTS INCORPORATED
Prakash Narayanan
G01 - MEASURING TESTING