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Sung-Bo Shim
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Gwangmyeong-si, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Method of predicting shape of semiconductor device
Patent number
11,341,305
Issue date
May 24, 2022
Samsung Electronics Co., Ltd.
Kwang-Hoon Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer measurement apparatus, wafer measurement system, and method o...
Patent number
10,790,200
Issue date
Sep 29, 2020
Samsung Electronics Co., Ltd.
Sung-Bo Shim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method of analyzing a crystal defect
Patent number
10,727,025
Issue date
Jul 28, 2020
Samsung Electronics Co., Ltd.
Sung-Bo Shim
G01 - MEASURING TESTING
Information
Patent Grant
Methods of measuring patterns and methods of manufacturing semicond...
Patent number
10,254,236
Issue date
Apr 9, 2019
Samsung Electronics Co., Ltd.
Sung-Bo Shim
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF PREDICTING SHAPE OF SEMICONDUCTOR DEVICE
Publication number
20200201952
Publication date
Jun 25, 2020
Samsung Electronics Co., Ltd.
KWANG-HOON KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD OF ANALYZING A CRYSTAL DEFECT
Publication number
20200020506
Publication date
Jan 16, 2020
Samsung Electronics Co., Ltd.
Sung-Bo Shim
G01 - MEASURING TESTING
Information
Patent Application
WAFER MEASUREMENT APPARATUS, WAFER MEASUREMENT SYSTEM, AND METHOD O...
Publication number
20190229023
Publication date
Jul 25, 2019
Samsung Electronics Co., Ltd.
SUNG-BO SHIM
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF MEASURING PATTERNS AND METHODS OF MANUFACTURING SEMICOND...
Publication number
20180088060
Publication date
Mar 29, 2018
SUNG-BO SHIM
G01 - MEASURING TESTING
Information
Patent Application
CELL STRING OF A MEMORY CELL ARRAY AND METHOD OF ERASING THE SAME
Publication number
20110211392
Publication date
Sep 1, 2011
Samsung Electronics Co., Ltd.
Jae-Ho Kim
G11 - INFORMATION STORAGE