Sung Ching Hung

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Changhua, TW

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor package
- Patent number 8,922,028
- Issue date Dec 30, 2014
- Advanced Semiconductor Engineering, Inc.
- Sung-Ching Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked semiconductor package
- Patent number 7,687,898
- Issue date Mar 30, 2010
- Advanced Semiconductor Engineering, Inc.
- Sung-Ching Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer and testing method for the same
- Patent number 6,768,332
- Issue date Jul 27, 2004
- Advanced Semiconductor Engineering Inc.
- Yueh Lung Lin
- G01 - MEASURING TESTING
Information Patent Grant
Testing module for testing the strength of the welding area on a PCB
- Patent number 6,234,029
- Issue date May 22, 2001
- Advanced Semiconductor Engineering, Inc.
- Ming-Shuoh Liang
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20110193209
- Publication date Aug 11, 2011
- Advanced Semiconductor Engineering, Inc.
- Sung-Ching Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STACKED SEMICONDUCTOR PACKAGE
- Publication number 20080191330
- Publication date Aug 14, 2008
- Advanced Semiconductor Engineering, Inc.
- Sung-Ching Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20080191329
- Publication date Aug 14, 2008
- Advanced Semiconductor Engineering, Inc.
- Sung-Ching Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semicondutor wafer device
- Publication number 20040032009
- Publication date Feb 19, 2004
- Advanced Semiconductor Engineering, Inc.
- Yao-Shin Fang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor wafer and testing method for the same
- Publication number 20040021479
- Publication date Feb 5, 2004
- Advanced Semiconductor Engineering, Inc.
- Yueh Lung Lin
- G01 - MEASURING TESTING