Sung Chung

Person

Campbell, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for fault injection
- Patent number 9,316,691
- Issue date Apr 19, 2016
- Eigenix
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Grant
Drive method for starting and operating a resonant scanning MEMS de...
- Patent number 8,606,410
- Issue date Dec 10, 2013
- Headway Technologies, Inc.
- David Drouin
- G02 - OPTICS
Information Patent Grant
Apparatus and system for implementing variable speed scan testing
- Patent number 8,578,226
- Issue date Nov 5, 2013
- Eigenix
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for three-dimensional depth image construction
- Patent number 8,472,699
- Issue date Jun 25, 2013
- Board of Trustees of the Leland Stanford Junior University
- Andrew Y. Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for implementing variable speed scan testing
- Patent number 8,386,866
- Issue date Feb 26, 2013
- Eigenix
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Grant
Ta/W film as heating device for dynamic fly height adjustment
- Patent number 8,054,583
- Issue date Nov 8, 2011
- Headway Technologies, Inc.
- Min Zheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Single event upset test circuit and methodology
- Patent number 7,673,202
- Issue date Mar 2, 2010
- Cisco Technology, Inc.
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Grant
Programmable in-situ delay fault test clock generator
- Patent number 7,536,617
- Issue date May 19, 2009
- Cisco Technology, Inc.
- Hong-Shin Jun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test buffer design and interface mechanism for differential receive...
- Patent number 7,487,412
- Issue date Feb 3, 2009
- Cisco Technology, Inc.
- Sang Hyeon Baeg
- G01 - MEASURING TESTING
Information Patent Grant
AC coupled line testing using boundary scan test methodology
- Patent number 7,269,770
- Issue date Sep 11, 2007
- Cisco Technology, Inc.
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Grant
AC coupled line testing using boundary scan test methodology
- Patent number 7,174,492
- Issue date Feb 6, 2007
- Cisco Technology, Inc.
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Grant
Test buffer design and interface mechanism for differential receive...
- Patent number 7,089,463
- Issue date Aug 8, 2006
- Cisco Technology Inc.
- Sang Hyeon Baeg
- G01 - MEASURING TESTING
Information Patent Grant
Programmable test pattern and capture mechanism for boundary scan
- Patent number 7,089,470
- Issue date Aug 8, 2006
- Cisco Technology, Inc.
- Sang Hyeon Baeg
- G01 - MEASURING TESTING
Information Patent Grant
Resolving LBIST timing violations
- Patent number 6,934,921
- Issue date Aug 23, 2005
- Cisco Technology, Inc.
- Xinli Gu
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism for enabling compliance with the IEEE standard 1149.1 for...
- Patent number 6,560,739
- Issue date May 6, 2003
- Cisco Technology, Inc.
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Grant
Mechanism for enabling compliance with the IEEE standard 1149.1 for...
- Patent number 6,446,230
- Issue date Sep 3, 2002
- Cisco Technology, Inc.
- Sung Soo Chung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS FOR IMPLEMENTING VARIABLE SPEED SCAN TESTING
- Publication number 20140310666
- Publication date Oct 16, 2014
- Eigenix
- Sung S. Chung
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Fault Injection
- Publication number 20120239993
- Publication date Sep 20, 2012
- Eigenix
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Application
Methods for implementing variable speed scan testing
- Publication number 20120047413
- Publication date Feb 23, 2012
- Eigenix
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and system for implementing variable speed scan testing
- Publication number 20120047412
- Publication date Feb 23, 2012
- Eigenix
- Sung Soo Chung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Drive method for starting and operating a resonant scanning MEMS de...
- Publication number 20110320046
- Publication date Dec 29, 2011
- HEADWAY TECHNOLOGIES, INC.
- David Drouin
- G02 - OPTICS
Information Patent Application
Ta/W film as heating device for dynamic fly height adjustment
- Publication number 20090323227
- Publication date Dec 31, 2009
- HEADWAY TECHNOLOGIES, INC.
- Min Zheng
- G11 - INFORMATION STORAGE
Information Patent Application
ARRANGEMENT AND METHOD FOR THREE-DIMENSIONAL DEPTH IMAGE CONSTRUCTION
- Publication number 20080137989
- Publication date Jun 12, 2008
- Andrew Y. Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Single event upset test circuit and methodology
- Publication number 20080091996
- Publication date Apr 17, 2008
- Cisco Technology, Inc.
- Sung Soo Chung
- G01 - MEASURING TESTING
Information Patent Application
Programmable in-situ delay fault test clock generator
- Publication number 20060242474
- Publication date Oct 26, 2006
- Cisco Technology, Inc.
- Hong-Shin Jun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test buffer design and interface mechanism for differential receive...
- Publication number 20060242487
- Publication date Oct 26, 2006
- Cisco Technology, Inc.
- Sang Hyeon Baeg
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method and apparatus for fault injection

Drive method for starting and operating a resonant scanning MEMS de...

Apparatus and system for implementing variable speed scan testing

Arrangement and method for three-dimensional depth image construction

Methods for implementing variable speed scan testing

Ta/W film as heating device for dynamic fly height adjustment

Single event upset test circuit and methodology

Programmable in-situ delay fault test clock generator

Test buffer design and interface mechanism for differential receive...

AC coupled line testing using boundary scan test methodology

AC coupled line testing using boundary scan test methodology

Test buffer design and interface mechanism for differential receive...

Programmable test pattern and capture mechanism for boundary scan

Resolving LBIST timing violations

Mechanism for enabling compliance with the IEEE standard 1149.1 for...

Mechanism for enabling compliance with the IEEE standard 1149.1 for...

Patents Applicationslast 30 patents

METHODS FOR IMPLEMENTING VARIABLE SPEED SCAN TESTING

Method and Apparatus for Fault Injection

Methods for implementing variable speed scan testing

Apparatus and system for implementing variable speed scan testing

Drive method for starting and operating a resonant scanning MEMS de...

Ta/W film as heating device for dynamic fly height adjustment

ARRANGEMENT AND METHOD FOR THREE-DIMENSIONAL DEPTH IMAGE CONSTRUCTION

Single event upset test circuit and methodology

Programmable in-situ delay fault test clock generator

Test buffer design and interface mechanism for differential receive...