Sung Jin Jo

Person

Gilbert, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Capacitance-to-voltage interface circuit
- Patent number 10,715,096
- Issue date Jul 14, 2020
- NXP USA, INC.
- Keith Kraver
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for evaluating a capacitive interface
- Patent number 9,547,037
- Issue date Jan 17, 2017
- NXP USA, INC.
- Divya Pratap
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance-to-voltage interface circuits
- Patent number 9,310,409
- Issue date Apr 12, 2016
- Freescale Semiconductor Inc.
- Ashish Khanna
- G01 - MEASURING TESTING
Information Patent Grant
Digital sample clock generator, a vibration gyroscope circuitry com...
- Patent number 9,116,562
- Issue date Aug 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Hugues Beaulaton
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical systems devices and methods for the fabricat...
- Patent number 9,003,886
- Issue date Apr 14, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Yizhen Lin
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance-to-voltage interface circuits
- Patent number 8,766,650
- Issue date Jul 1, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Ashish Khanna
- G01 - MEASURING TESTING
Information Patent Grant
Offset error automatic calibration integrated circuit
- Patent number 8,689,604
- Issue date Apr 8, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Offset error automatic calibration integrated circuit
- Patent number 8,321,170
- Issue date Nov 27, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Peter S. Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance-to-voltage interface circuit, and related operating met...
- Patent number 8,125,231
- Issue date Feb 28, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Ashish Khanna
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance-to-voltage interface circuit with shared capacitor bank...
- Patent number 7,969,167
- Issue date Jun 28, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Ashish Khanna
- G01 - MEASURING TESTING
Information Patent Grant
Charge redistribution successive approximation analog-to-digital co...
- Patent number 7,796,079
- Issue date Sep 14, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Ashish Khanna
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing circuit and method for MEMS sensor packaged with an integra...
- Patent number 6,744,264
- Issue date Jun 1, 2004
- Motorola, Inc.
- Bishnu P. Gogoi
- G01 - MEASURING TESTING
Information Patent Grant
Tire pressure monitoring system
- Patent number 5,883,305
- Issue date Mar 16, 1999
- Motorola, Inc.
- Sung Jin Jo
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
TRIM CIRCUIT AND METHOD OF OSCILLATOR DRIVE CIRCUIT PHASE CALIBRATION
- Publication number 20220326044
- Publication date Oct 13, 2022
- NXP USA, Inc.
- Raghavendra N. Sridhar
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR EVALUATING A CAPACITIVE INTERFACE
- Publication number 20150233995
- Publication date Aug 20, 2015
- FREESCALE SEMICONDUCTOR, INC.
- DIVYA PRATAP
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL SAMPLE CLOCK GENERATOR, A VIBRATION GYROSCOPE CIRCUITRY COM...
- Publication number 20150177775
- Publication date Jun 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Hugues Beaulation
- G01 - MEASURING TESTING
Information Patent Application
CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUITS
- Publication number 20140253148
- Publication date Sep 11, 2014
- ASHISH KHANNA
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTROMECHANICAL SYSTEMS DEVICES AND METHODS FOR THE FABRICAT...
- Publication number 20130283913
- Publication date Oct 31, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Yizhen Lin
- G01 - MEASURING TESTING
Information Patent Application
OFFSET ERROR AUTOMATIC CALIBRATION INTEGRATED CIRCUIT
- Publication number 20130061649
- Publication date Mar 14, 2013
- FREESCALE SEMICONDUCTOR, INC.
- PETER S. SCHULTZ
- G01 - MEASURING TESTING
Information Patent Application
CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUITS
- Publication number 20120105079
- Publication date May 3, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Ashish Khanna
- G01 - MEASURING TESTING
Information Patent Application
OFFSET ERROR AUTOMATIC CALIBRATION INTEGRATED CIRCUIT
- Publication number 20110208460
- Publication date Aug 25, 2011
- Peter S. Schultz
- G01 - MEASURING TESTING
Information Patent Application
CHARGE REDISTRIBUTION SUCCESSIVE APPROXIMATION ANALOG-TO-DIGITAL CO...
- Publication number 20100188278
- Publication date Jul 29, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Ashish Khanna
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUIT, AND RELATED OPERATING MET...
- Publication number 20100188105
- Publication date Jul 29, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Ashish Khanna
- G01 - MEASURING TESTING
Information Patent Application
CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUIT WITH SHARED CAPACITOR BANK...
- Publication number 20100188107
- Publication date Jul 29, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Ashish Khanna
- G01 - MEASURING TESTING
Information Patent Application
Testing circuit and method for MEMS sensor packaged with an integra...
- Publication number 20030201777
- Publication date Oct 30, 2003
- Bishnu P. Gogoi
- G01 - MEASURING TESTING

Sung Jin Jo

Person

Patents Grantslast 30 patents

Capacitance-to-voltage interface circuit

System and method for evaluating a capacitive interface

Capacitance-to-voltage interface circuits

Digital sample clock generator, a vibration gyroscope circuitry com...

Microelectromechanical systems devices and methods for the fabricat...

Capacitance-to-voltage interface circuits

Offset error automatic calibration integrated circuit

Offset error automatic calibration integrated circuit

Capacitance-to-voltage interface circuit, and related operating met...

Capacitance-to-voltage interface circuit with shared capacitor bank...

Charge redistribution successive approximation analog-to-digital co...

Testing circuit and method for MEMS sensor packaged with an integra...

Tire pressure monitoring system

Patents Applicationslast 30 patents

TRIM CIRCUIT AND METHOD OF OSCILLATOR DRIVE CIRCUIT PHASE CALIBRATION

SYSTEM AND METHOD FOR EVALUATING A CAPACITIVE INTERFACE

DIGITAL SAMPLE CLOCK GENERATOR, A VIBRATION GYROSCOPE CIRCUITRY COM...

CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUITS

MICROELECTROMECHANICAL SYSTEMS DEVICES AND METHODS FOR THE FABRICAT...

OFFSET ERROR AUTOMATIC CALIBRATION INTEGRATED CIRCUIT

CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUITS

OFFSET ERROR AUTOMATIC CALIBRATION INTEGRATED CIRCUIT

CHARGE REDISTRIBUTION SUCCESSIVE APPROXIMATION ANALOG-TO-DIGITAL CO...

CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUIT, AND RELATED OPERATING MET...

CAPACITANCE-TO-VOLTAGE INTERFACE CIRCUIT WITH SHARED CAPACITOR BANK...

Testing circuit and method for MEMS sensor packaged with an integra...