Sung Jin Jo

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Gilbert, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing integrated circuit and integrated circuit config...
- Patent number 9,494,646
- Issue date Nov 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Divya Pratap
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING INTEGRATED CIRCUIT AND INTEGRATED CIRCUIT CONFIG...
- Publication number 20150260785
- Publication date Sep 17, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Divya Pratap
- G01 - MEASURING TESTING