Sungchul Yoo

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for combining x-ray metrology data sets to impr...
- Patent number 11,990,380
- Issue date May 21, 2024
- KLA Corporation
- Christopher Liman
- G01 - MEASURING TESTING
Information Patent Grant
Multi-model metrology
- Patent number 9,412,673
- Issue date Aug 9, 2016
- KLA-Tencor Corporation
- In-Kyo Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Secondary target design for optical measurements
- Patent number 9,311,431
- Issue date Apr 12, 2016
- KLA-Tencor Corporation
- Sungchul Yoo
- G01 - MEASURING TESTING
Information Patent Grant
Methods for measurement or analysis of a nitrogen concentration of...
- Patent number 7,349,079
- Issue date Mar 25, 2008
- KLA-Tencor Technologies Corp.
- Qiang Zhao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-Ray Scatterometry Based Measurements Of Memory Array Structures S...
- Publication number 20240302301
- Publication date Sep 12, 2024
- KLA Corporation
- Sandeep Inampudi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods And Systems For Combining X-Ray Metrology Data Sets To Impr...
- Publication number 20200335406
- Publication date Oct 22, 2020
- KLA Corporation
- Christopher Liman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-MODEL METROLOGY
- Publication number 20160322267
- Publication date Nov 3, 2016
- KLA-Tencor Corporation
- In-Kyo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-MODEL METROLOGY
- Publication number 20150058813
- Publication date Feb 26, 2015
- KLA-Tencor Corporation
- In-Kyo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Secondary Target Design for Optical Measurements
- Publication number 20130116978
- Publication date May 9, 2013
- KLA-TENCOR CORPORATION
- Sungchul Yoo
- G01 - MEASURING TESTING
Information Patent Application
Methods for measurement or analysis of a nitrogen concentration of...
- Publication number 20050254049
- Publication date Nov 17, 2005
- Qiang Zhao
- G01 - MEASURING TESTING