Sunghan JUNG

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Conductivity detector and ion chromatography system including the same
- Patent number 10,234,435
- Issue date Mar 19, 2019
- Samsung Electronics Co., Ltd.
- Sunghan Jung
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE ANALYSIS SYSTEM
- Publication number 20240310397
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Kyeongsup Byeon
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTIVITY DETECTOR AND ION CHROMATOGRAPHY SYSTEM INCLUDING THE SAME
- Publication number 20170108476
- Publication date Apr 20, 2017
- Sunghan JUNG
- G01 - MEASURING TESTING