Sungho JANG

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Hyperspectral imaging (HSI) apparatus and inspection apparatus incl...
- Patent number 11,898,912
- Issue date Feb 13, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Grant
Extreme ultraviolet (EUV) collector inspection apparatus and method
- Patent number 11,676,263
- Issue date Jun 13, 2023
- Samsung Electronics Co., Ltd.
- Dong-Hyub Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device
- Patent number 11,521,977
- Issue date Dec 6, 2022
- Samsung Electronics Co., Ltd.
- Kiseok Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of exposure using extreme ultraviolet and method of manufact...
- Patent number 11,490,499
- Issue date Nov 1, 2022
- Samsung Electronics Co., Ltd.
- Sungho Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit devices
- Patent number 11,437,089
- Issue date Sep 6, 2022
- Samsung Electronics Co., Ltd.
- Taesung Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extreme ultraviolet exposure system
- Patent number 11,016,400
- Issue date May 25, 2021
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical emission spectroscopy calibration device and system includi...
- Patent number 10,871,396
- Issue date Dec 22, 2020
- Samsung Electronics Co., Ltd.
- Jongsu Kim
- G02 - OPTICS
Information Patent Grant
Apparatus for and method of performing inspection and metrology pro...
- Patent number 10,732,129
- Issue date Aug 4, 2020
- SAMASUNG ELECTRONICS CO., LTD.
- Kwang Soo Kim
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device and method of manufacturing the same
- Patent number 10,332,890
- Issue date Jun 25, 2019
- Samsung Electronics Co., Ltd.
- Kiseok Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices and methods of forming the same
- Patent number 9,947,668
- Issue date Apr 17, 2018
- Samsung Electronics Co., Ltd.
- Dongjin Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device compensating difference of bitline inte...
- Patent number 9,595,315
- Issue date Mar 14, 2017
- Samsung Electronics Co., Ltd.
- Joon Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 9,337,199
- Issue date May 10, 2016
- Samsung Electronics Co., Ltd.
- Jiyoung Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices having a silicon-germanium channel layer and...
- Patent number 9,305,928
- Issue date Apr 5, 2016
- Samsung Electronics Co., Ltd.
- Youngkuk Kim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20240306371
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- HAEIN JUNG
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240292604
- Publication date Aug 29, 2024
- Samsung Electronics Co., Ltd.
- Jiseong KIM
Information Patent Application
PLASMA DENSITY MEASUREMENT SENSOR, APPARATUS FOR MEASURING REAL-TIM...
- Publication number 20240274418
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA MONITORING SYSTEM AND METHOD OF MONITORING PLASMA
- Publication number 20240274419
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Kwangho LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES
- Publication number 20240268098
- Publication date Aug 8, 2024
- Samsung Electronics Co., Ltd.
- Junsoo KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A PERIPHERAL CIRCUIT DEVICE
- Publication number 20240268105
- Publication date Aug 8, 2024
- Samsung Electronics Co., Ltd.
- Seunghwan KIM
Information Patent Application
SEMICONDUCTOR DEVICES
- Publication number 20240268103
- Publication date Aug 8, 2024
- Samsung Electronics Co., Ltd.
- Junsoo KIM
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240251549
- Publication date Jul 25, 2024
- Samsung Electronics Co., Ltd.
- SANGGYU KO
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240243059
- Publication date Jul 18, 2024
- Samsung Electronics Co., Ltd.
- SUNGHO JANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240230314
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR MEASURING RADICAL DENSITY DISTRIBUTION BASED ON LIGHT...
- Publication number 20240159657
- Publication date May 16, 2024
- Samsung Electronics Co., Ltd.
- Sejin OH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240133673
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Garam CHOI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD MONITORING SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20240128102
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- SUNGHO JANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
- Publication number 20240118072
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20240060185
- Publication date Feb 22, 2024
- Samsung Electronics Co., Ltd.
- Yeontae KIM
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR PROCESS DEVICE
- Publication number 20240047247
- Publication date Feb 8, 2024
- Samsung Electronics Co., Ltd.
- Chansoo KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230422479
- Publication date Dec 28, 2023
- Samsung Electronics Co., Ltd.
- Jeesun Lee
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230400404
- Publication date Dec 14, 2023
- Samsung Electronics Co., Ltd.
- Garam Choi
- G01 - MEASURING TESTING
Information Patent Application
STEALTH DICING LASER DEVICE
- Publication number 20230187235
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Akinori OKUBO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230186460
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Myungjun LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20230114817
- Publication date Apr 13, 2023
- Samsung Electronics Co., Ltd.
- Inho SHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR ARCING DIAGNOSIS, PLASMA PROCESS EQUIPMENT INCLUDING...
- Publication number 20230109672
- Publication date Apr 13, 2023
- Samsung Electronics Co., Ltd.
- Changsoon Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA ETCHING APPARATUS AND SEMICONDUCTOR PROCESSING SYSTEM
- Publication number 20230078095
- Publication date Mar 16, 2023
- Samsung Electronics Co., Ltd.
- Dougyong SUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA CONFINEMENT RING, SEMICONDUCTOR MANUFACTURING APPARATUS INCL...
- Publication number 20220351947
- Publication date Nov 3, 2022
- Samsung Electronics Co., Ltd.
- Kuihyun YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXTREME ULTRAVIOLET (EUV) COLLECTOR INSPECTION APPARATUS AND METHOD
- Publication number 20220309643
- Publication date Sep 29, 2022
- Samsung Electronics Co., Ltd.
- Dong-Hyub Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCL...
- Publication number 20220170792
- Publication date Jun 2, 2022
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEVICES
- Publication number 20220076732
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- Taesung KANG
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF EXPOSURE USING EXTREME ULTRAVIOLET AND METHOD OF MANUFACT...
- Publication number 20220070992
- Publication date Mar 3, 2022
- Samsung Electronics Co., Ltd.
- SUNGHO JANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20210408008
- Publication date Dec 30, 2021
- Samsung Electronics Co., Ltd.
- Kiseok LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DROPLET GENERATOR AND EXTREME ULTRAVIOLET EXPOSURE DEVICE INCLUDING...
- Publication number 20210153332
- Publication date May 20, 2021
- Samsung Electronics Co., Ltd.
- Injae LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Sungho JANG

Person

Patents Grantslast 30 patents

Hyperspectral imaging (HSI) apparatus and inspection apparatus incl...

Extreme ultraviolet (EUV) collector inspection apparatus and method

Semiconductor memory device

Method of exposure using extreme ultraviolet and method of manufact...

Integrated circuit devices

Extreme ultraviolet exposure system

Optical emission spectroscopy calibration device and system includi...

Apparatus for and method of performing inspection and metrology pro...

Semiconductor memory device and method of manufacturing the same

Semiconductor devices and methods of forming the same

Semiconductor memory device compensating difference of bitline inte...

Semiconductor device and method of fabricating the same

Semiconductor devices having a silicon-germanium channel layer and...

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE

PLASMA DENSITY MEASUREMENT SENSOR, APPARATUS FOR MEASURING REAL-TIM...

PLASMA MONITORING SYSTEM AND METHOD OF MONITORING PLASMA

SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICE INCLUDING A PERIPHERAL CIRCUIT DEVICE

SEMICONDUCTOR DEVICES

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR MEASUREMENT APPARATUS

APPARATUS FOR MEASURING RADICAL DENSITY DISTRIBUTION BASED ON LIGHT...

SEMICONDUCTOR MEASUREMENT APPARATUS

APPARATUS AND METHOD MONITORING SEMICONDUCTOR MANUFACTURING EQUIPMENT

LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

SUBSTRATE PROCESSING APPARATUS

SEMICONDUCTOR PROCESS DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR MEASUREMENT APPARATUS

STEALTH DICING LASER DEVICE

SEMICONDUCTOR MEASUREMENT APPARATUS

SEMICONDUCTOR MEASUREMENT APPARATUS

APPARATUS FOR ARCING DIAGNOSIS, PLASMA PROCESS EQUIPMENT INCLUDING...

PLASMA ETCHING APPARATUS AND SEMICONDUCTOR PROCESSING SYSTEM

PLASMA CONFINEMENT RING, SEMICONDUCTOR MANUFACTURING APPARATUS INCL...

EXTREME ULTRAVIOLET (EUV) COLLECTOR INSPECTION APPARATUS AND METHOD

HYPERSPECTRAL IMAGING (HSI) APPARATUS AND INSPECTION APPARATUS INCL...

INTEGRATED CIRCUIT DEVICES

METHOD OF EXPOSURE USING EXTREME ULTRAVIOLET AND METHOD OF MANUFACT...

SEMICONDUCTOR MEMORY DEVICE

DROPLET GENERATOR AND EXTREME ULTRAVIOLET EXPOSURE DEVICE INCLUDING...