Sungho Kang

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Scan correlation-aware scan cluster reordering method and apparatus...
- Patent number 12,000,891
- Issue date Jun 4, 2024
- UIF (University Industry Foundation), Yonsei University
- Sungho Kang
- G01 - MEASURING TESTING
Information Patent Grant
Scan apparatus capable of fault diagnosis and scan chain fault diag...
- Patent number 11,567,132
- Issue date Jan 31, 2023
- UIF (University Industry Foundation), Yonsei University
- Sungho Kang
- G01 - MEASURING TESTING
Information Patent Grant
On-chip security circuit for detecting and protecting against invas...
- Patent number 11,387,196
- Issue date Jul 12, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for built in redundancy analysis with dynamic...
- Patent number 11,386,973
- Issue date Jul 12, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Stacked memory apparatus using error correction code and repairing...
- Patent number 11,315,657
- Issue date Apr 26, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three dimensional integrated circuit having redundant through silic...
- Patent number 10,403,555
- Issue date Sep 3, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked memory device using base die spare cell and method of repai...
- Patent number 10,395,755
- Issue date Aug 27, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional integrated circuit
- Patent number 10,170,398
- Issue date Jan 1, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a global buffer shared by a pluralit...
- Patent number 10,157,152
- Issue date Dec 18, 2018
- SK Hynix Inc.
- Kihyun Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method for testing the same
- Patent number 10,001,525
- Issue date Jun 19, 2018
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-core device, test device, and method of diagnosing failure
- Patent number 9,672,128
- Issue date Jun 6, 2017
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for repairing memory
- Patent number 9,666,309
- Issue date May 30, 2017
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of generating voltage island for 3D many-core chip multiproc...
- Patent number 9,230,051
- Issue date Jan 5, 2016
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for repair analysis
- Patent number 8,601,330
- Issue date Dec 3, 2013
- Hynix Semiconductor Inc.
- Woo-Sik Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for storing error information of memory
- Patent number 8,432,758
- Issue date Apr 30, 2013
- Hynix Semiconductor Inc.
- Woo-Sik Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for reducing number of transitions generated b...
- Patent number 7,428,681
- Issue date Sep 23, 2008
- Yonsei University
- Sungho Kang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS
- Publication number 20250006286
- Publication date Jan 2, 2025
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G11 - INFORMATION STORAGE
Information Patent Application
SCAN CHAIN SECURITY CIRCUIT AND DRIVING METHOD THEREOF
- Publication number 20240280633
- Publication date Aug 22, 2024
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G01 - MEASURING TESTING
Information Patent Application
SCAN CELL PLACING METHOD AND SCAN CELL PLACING APPARATUS
- Publication number 20230205172
- Publication date Jun 29, 2023
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVIC...
- Publication number 20230070785
- Publication date Mar 9, 2023
- Industry-Academic Cooperation Foundation, Yonsei University
- YOUNGKWANG LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING TH...
- Publication number 20230072965
- Publication date Mar 9, 2023
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAG...
- Publication number 20220381825
- Publication date Dec 1, 2022
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR BUILT IN REDUNDANCY ANALYSIS WITH DYNAMIC...
- Publication number 20200395093
- Publication date Dec 17, 2020
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G11 - INFORMATION STORAGE
Information Patent Application
ON-CHIP SECURITY CIRCUIT FOR DETECTING AND PROTECTING AGAINST INVAS...
- Publication number 20200395315
- Publication date Dec 17, 2020
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIRING...
- Publication number 20200243159
- Publication date Jul 30, 2020
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE DIMENSIONAL INTEGRATED CIRCUIT HAVING REDUNDANT THROUGH SILIC...
- Publication number 20190181061
- Publication date Jun 13, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STACKED MEMORY DEVICE USING BASE DIE SPARE CELL AND METHOD OF REPAI...
- Publication number 20190180840
- Publication date Jun 13, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-DIMENSIONAL INTEGRATED CIRCUIT
- Publication number 20170229381
- Publication date Aug 10, 2017
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A GLOBAL BUFFER SHARED BY A PLURALIT...
- Publication number 20160154750
- Publication date Jun 2, 2016
- SK HYNIX INC.
- Kihyun PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME
- Publication number 20160097810
- Publication date Apr 7, 2016
- INDUSTRY-ACA-DEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
- Sungho KANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF GENERATING VOLTAGE ISLAND FOR 3D MANY-CORE CHIP MULTIPROC...
- Publication number 20150193571
- Publication date Jul 9, 2015
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR REPAIRING MEMORY
- Publication number 20150071018
- Publication date Mar 12, 2015
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-CORE DEVICE, TEST DEVICE, AND METHOD OF DIAGNOSING FAILURE
- Publication number 20140208165
- Publication date Jul 24, 2014
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR REPAIR ANALYSIS
- Publication number 20120131396
- Publication date May 24, 2012
- Woo-Sik JEONG
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE AND METHOD FOR STORING ERROR INFORMATION OF MEMORY
- Publication number 20120127813
- Publication date May 24, 2012
- Hynix Semiconductor Inc.
- Woo-Sik JEONG
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for reducing number of transitions generated b...
- Publication number 20070011533
- Publication date Jan 11, 2007
- YONSEI UNIVERSITY.
- Sungho Kang
- G01 - MEASURING TESTING
Information Patent Application
Method of reducing hardware overhead upon generation of test patter...
- Publication number 20060156131
- Publication date Jul 13, 2006
- YONSEI UNIVERSITY.
- Sungho Kang
- G01 - MEASURING TESTING

Sungho Kang

Person

Patents Grantslast 30 patents

Scan correlation-aware scan cluster reordering method and apparatus...

Scan apparatus capable of fault diagnosis and scan chain fault diag...

On-chip security circuit for detecting and protecting against invas...

Method and apparatus for built in redundancy analysis with dynamic...

Stacked memory apparatus using error correction code and repairing...

Three dimensional integrated circuit having redundant through silic...

Stacked memory device using base die spare cell and method of repai...

Three-dimensional integrated circuit

Semiconductor device including a global buffer shared by a pluralit...

Semiconductor device and method for testing the same

Multi-core device, test device, and method of diagnosing failure

Method and device for repairing memory

Method of generating voltage island for 3D many-core chip multiproc...

Device and method for repair analysis

Device and method for storing error information of memory

Method and apparatus for reducing number of transitions generated b...

Patents Applicationslast 30 patents

NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS

SCAN CHAIN SECURITY CIRCUIT AND DRIVING METHOD THEREOF

SCAN CELL PLACING METHOD AND SCAN CELL PLACING APPARATUS

SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVIC...

METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING TH...

SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAG...

METHOD AND APPARATUS FOR BUILT IN REDUNDANCY ANALYSIS WITH DYNAMIC...

ON-CHIP SECURITY CIRCUIT FOR DETECTING AND PROTECTING AGAINST INVAS...

STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIRING...

THREE DIMENSIONAL INTEGRATED CIRCUIT HAVING REDUNDANT THROUGH SILIC...

STACKED MEMORY DEVICE USING BASE DIE SPARE CELL AND METHOD OF REPAI...

THREE-DIMENSIONAL INTEGRATED CIRCUIT

SEMICONDUCTOR DEVICE INCLUDING A GLOBAL BUFFER SHARED BY A PLURALIT...

SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME

METHOD OF GENERATING VOLTAGE ISLAND FOR 3D MANY-CORE CHIP MULTIPROC...

METHOD AND DEVICE FOR REPAIRING MEMORY

MULTI-CORE DEVICE, TEST DEVICE, AND METHOD OF DIAGNOSING FAILURE

DEVICE AND METHOD FOR REPAIR ANALYSIS

DEVICE AND METHOD FOR STORING ERROR INFORMATION OF MEMORY

Method and apparatus for reducing number of transitions generated b...

Method of reducing hardware overhead upon generation of test patter...