SUNGHO KANG

Person

Osan-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Camera module
- Patent number 12,321,086
- Issue date Jun 3, 2025
- SAMSUNG ELECTRO-MECHANICS CO., LTD.
- Sungho Kang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of repairing through-electrodes, repair device performing th...
- Patent number 12,283,529
- Issue date Apr 22, 2025
- Samsung Electronics Co., Ltd.
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic device, image processing method of electronic device, an...
- Patent number 12,175,361
- Issue date Dec 24, 2024
- Samsung Electronics Co., Ltd.
- Cheon Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing learning of deep neural network and apparatus...
- Patent number 12,001,954
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan correlation-aware scan cluster reordering method and apparatus...
- Patent number 12,000,891
- Issue date Jun 4, 2024
- UIF (University Industry Foundation), Yonsei University
- Sungho Kang
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing learning of deep neural network and apparatus...
- Patent number 11,966,846
- Issue date Apr 23, 2024
- Samsung Electronics Co., Ltd.
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of performing learning of deep neural network and apparatus...
- Patent number 11,809,954
- Issue date Nov 7, 2023
- Samsung Electronics Co., Ltd.
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for controlling data input and output of fully co...
- Patent number 11,755,904
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Hyungdal Kwon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scan apparatus capable of fault diagnosis and scan chain fault diag...
- Patent number 11,567,132
- Issue date Jan 31, 2023
- UIF (University Industry Foundation), Yonsei University
- Sungho Kang
- G01 - MEASURING TESTING
Information Patent Grant
Extreme ultraviolet (EUV) mask inspection system, a load-lock chamb...
- Patent number 11,531,277
- Issue date Dec 20, 2022
- Samsung Electronics Co., Ltd.
- Jihoon Na
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electronic device and control method therefor
- Patent number 11,430,137
- Issue date Aug 30, 2022
- Samsung Electronics Co., Ltd.
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-chip security circuit for detecting and protecting against invas...
- Patent number 11,387,196
- Issue date Jul 12, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for built in redundancy analysis with dynamic...
- Patent number 11,386,973
- Issue date Jul 12, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Stacked memory apparatus using error correction code and repairing...
- Patent number 11,315,657
- Issue date Apr 26, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three dimensional integrated circuit having redundant through silic...
- Patent number 10,403,555
- Issue date Sep 3, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked memory device using base die spare cell and method of repai...
- Patent number 10,395,755
- Issue date Aug 27, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional integrated circuit
- Patent number 10,170,398
- Issue date Jan 1, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a global buffer shared by a pluralit...
- Patent number 10,157,152
- Issue date Dec 18, 2018
- SK Hynix Inc.
- Kihyun Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing semiconductor device using surface treatmen...
- Patent number 10,043,799
- Issue date Aug 7, 2018
- Samsung Electronics Co., Ltd.
- Jaeyoung Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for testing the same
- Patent number 10,001,525
- Issue date Jun 19, 2018
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi embedded timing controller, display panel, and computer syste...
- Patent number 9,947,290
- Issue date Apr 17, 2018
- Samsung Electronics Co., Ltd.
- Sungho Kang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Multi-core device, test device, and method of diagnosing failure
- Patent number 9,672,128
- Issue date Jun 6, 2017
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for repairing memory
- Patent number 9,666,309
- Issue date May 30, 2017
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing semiconductor device using surface treatmen...
- Patent number 9,576,840
- Issue date Feb 21, 2017
- Samsung Electronics Co., Ltd.
- Jaeyoung Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma treating apparatus, substrate treating method, and method of...
- Patent number 9,362,137
- Issue date Jun 7, 2016
- Samsung Electronics Co., Ltd.
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of generating voltage island for 3D many-core chip multiproc...
- Patent number 9,230,051
- Issue date Jan 5, 2016
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of thermally treating a semiconductor wafer
- Patent number 8,854,614
- Issue date Oct 7, 2014
- Samsung Electronics Co., Ltd.
- Jong-Hoon Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for repair analysis
- Patent number 8,601,330
- Issue date Dec 3, 2013
- Hynix Semiconductor Inc.
- Woo-Sik Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for storing error information of memory
- Patent number 8,432,758
- Issue date Apr 30, 2013
- Hynix Semiconductor Inc.
- Woo-Sik Jeong
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for reducing number of transitions generated b...
- Patent number 7,428,681
- Issue date Sep 23, 2008
- Yonsei University
- Sungho Kang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING TH...
- Publication number 20250226268
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR PRE-ANALYZING MEMORY FAULT INFORMATION
- Publication number 20250094269
- Publication date Mar 20, 2025
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS
- Publication number 20250006286
- Publication date Jan 2, 2025
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G11 - INFORMATION STORAGE
Information Patent Application
SCAN CHAIN SECURITY CIRCUIT AND DRIVING METHOD THEREOF
- Publication number 20240280633
- Publication date Aug 22, 2024
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G01 - MEASURING TESTING
Information Patent Application
LENS DRIVING APPARATUS AND CAMERA MODULE INCLUDING THE SAME
- Publication number 20240168362
- Publication date May 23, 2024
- Samsung Electro-Mechanics Co., Ltd.
- Sungho KANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SCAN CELL PLACING METHOD AND SCAN CELL PLACING APPARATUS
- Publication number 20230205172
- Publication date Jun 29, 2023
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G05 - CONTROLLING REGULATING
Information Patent Application
CAMERA MODULE
- Publication number 20230185168
- Publication date Jun 15, 2023
- Samsung Electro-Mechanics Co., Ltd.
- Sungho KANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVIC...
- Publication number 20230070785
- Publication date Mar 9, 2023
- Industry-Academic Cooperation Foundation, Yonsei University
- YOUNGKWANG LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING TH...
- Publication number 20230072965
- Publication date Mar 9, 2023
- Sungho Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAG...
- Publication number 20220381825
- Publication date Dec 1, 2022
- UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
- Sungho KANG
- G01 - MEASURING TESTING
Information Patent Application
EXTREME ULTRAVIOLET (EUV) MASK INSPECTION SYSTEM, A LOAD-LOCK CHAMB...
- Publication number 20220283519
- Publication date Sep 8, 2022
- Samsung Electronics Co., Ltd.
- Jihoon Na
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ELECTRONIC DEVICE AND CONTROL METHOD THEREFOR
- Publication number 20210035309
- Publication date Feb 4, 2021
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC DEVICE, IMAGE PROCESSING METHOD OF ELECTRONIC DEVICE, AN...
- Publication number 20200401889
- Publication date Dec 24, 2020
- Samsung Electronics Co., LTD
- Cheon LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR BUILT IN REDUNDANCY ANALYSIS WITH DYNAMIC...
- Publication number 20200395093
- Publication date Dec 17, 2020
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G11 - INFORMATION STORAGE
Information Patent Application
ON-CHIP SECURITY CIRCUIT FOR DETECTING AND PROTECTING AGAINST INVAS...
- Publication number 20200395315
- Publication date Dec 17, 2020
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR CONTROLLING DATA INPUT AND OUTPUT OF FULLY CO...
- Publication number 20200380363
- Publication date Dec 3, 2020
- Samsung Electronics Co., Ltd.
- Hyungdal KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIRING...
- Publication number 20200243159
- Publication date Jul 30, 2020
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF PERFORMING LEARNING OF DEEP NEURAL NETWORK AND APPARATUS...
- Publication number 20190258932
- Publication date Aug 22, 2019
- Samsung Electronics Co., Ltd.
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE DIMENSIONAL INTEGRATED CIRCUIT HAVING REDUNDANT THROUGH SILIC...
- Publication number 20190181061
- Publication date Jun 13, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STACKED MEMORY DEVICE USING BASE DIE SPARE CELL AND METHOD OF REPAI...
- Publication number 20190180840
- Publication date Jun 13, 2019
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-DIMENSIONAL INTEGRATED CIRCUIT
- Publication number 20170229381
- Publication date Aug 10, 2017
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SURFACE TREATMEN...
- Publication number 20170125418
- Publication date May 4, 2017
- Samsung Electronics Co., Ltd.
- JAEYOUNG PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA TREATING APPARATUS, SUBSTRATE TREATING METHOD, AND METHOD OF...
- Publication number 20160225586
- Publication date Aug 4, 2016
- SUNGHO KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A GLOBAL BUFFER SHARED BY A PLURALIT...
- Publication number 20160154750
- Publication date Jun 2, 2016
- SK HYNIX INC.
- Kihyun PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME
- Publication number 20160097810
- Publication date Apr 7, 2016
- INDUSTRY-ACA-DEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
- Sungho KANG
- G01 - MEASURING TESTING
Information Patent Application
PLASMA TREATING APPARATUS, SUBSTRATE TREATING METHOD, AND METHOD OF...
- Publication number 20160049312
- Publication date Feb 18, 2016
- SUNGHO KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF GENERATING VOLTAGE ISLAND FOR 3D MANY-CORE CHIP MULTIPROC...
- Publication number 20150193571
- Publication date Jul 9, 2015
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SURFACE TREATMEN...
- Publication number 20150147861
- Publication date May 28, 2015
- JAEYOUNG PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR REPAIRING MEMORY
- Publication number 20150071018
- Publication date Mar 12, 2015
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho Kang
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-CORE DEVICE, TEST DEVICE, AND METHOD OF DIAGNOSING FAILURE
- Publication number 20140208165
- Publication date Jul 24, 2014
- Industry-Academic Cooperation Foundation, Yonsei University
- Sungho KANG
- G06 - COMPUTING CALCULATING COUNTING

SUNGHO KANG

Person

Patents Grantslast 30 patents

Camera module

Method of repairing through-electrodes, repair device performing th...

Electronic device, image processing method of electronic device, an...

Method of performing learning of deep neural network and apparatus...

Scan correlation-aware scan cluster reordering method and apparatus...

Method of performing learning of deep neural network and apparatus...

Method of performing learning of deep neural network and apparatus...

Method and device for controlling data input and output of fully co...

Scan apparatus capable of fault diagnosis and scan chain fault diag...

Extreme ultraviolet (EUV) mask inspection system, a load-lock chamb...

Electronic device and control method therefor

On-chip security circuit for detecting and protecting against invas...

Method and apparatus for built in redundancy analysis with dynamic...

Stacked memory apparatus using error correction code and repairing...

Three dimensional integrated circuit having redundant through silic...

Stacked memory device using base die spare cell and method of repai...

Three-dimensional integrated circuit

Semiconductor device including a global buffer shared by a pluralit...

Method of manufacturing semiconductor device using surface treatmen...

Semiconductor device and method for testing the same

Multi embedded timing controller, display panel, and computer syste...

Multi-core device, test device, and method of diagnosing failure

Method and device for repairing memory

Method of manufacturing semiconductor device using surface treatmen...

Plasma treating apparatus, substrate treating method, and method of...

Method of generating voltage island for 3D many-core chip multiproc...

Methods of thermally treating a semiconductor wafer

Device and method for repair analysis

Device and method for storing error information of memory

Method and apparatus for reducing number of transitions generated b...

Patents Applicationslast 30 patents

METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING TH...

APPARATUS AND METHOD FOR PRE-ANALYZING MEMORY FAULT INFORMATION

NON-LINEAR MEMORY FAILURE ANALYSIS METHOD AND MEMORY TEST APPARATUS

SCAN CHAIN SECURITY CIRCUIT AND DRIVING METHOD THEREOF

LENS DRIVING APPARATUS AND CAMERA MODULE INCLUDING THE SAME

SCAN CELL PLACING METHOD AND SCAN CELL PLACING APPARATUS

CAMERA MODULE

SEMICONDUCTOR DEVICE INCLUDING THROUGH-SILICON VIA (TSV) TEST DEVIC...

METHOD OF REPAIRING THROUGH-ELECTRODES, REPAIR DEVICE PERFORMING TH...

SCAN APPARATUS CAPABLE OF FAULT DIAGNOSIS AND SCAN CHAIN FAULT DIAG...

EXTREME ULTRAVIOLET (EUV) MASK INSPECTION SYSTEM, A LOAD-LOCK CHAMB...

ELECTRONIC DEVICE AND CONTROL METHOD THEREFOR

ELECTRONIC DEVICE, IMAGE PROCESSING METHOD OF ELECTRONIC DEVICE, AN...

METHOD AND APPARATUS FOR BUILT IN REDUNDANCY ANALYSIS WITH DYNAMIC...

ON-CHIP SECURITY CIRCUIT FOR DETECTING AND PROTECTING AGAINST INVAS...

METHOD AND DEVICE FOR CONTROLLING DATA INPUT AND OUTPUT OF FULLY CO...

STACKED MEMORY APPARATUS USING ERROR CORRECTION CODE AND REPAIRING...

METHOD OF PERFORMING LEARNING OF DEEP NEURAL NETWORK AND APPARATUS...

THREE DIMENSIONAL INTEGRATED CIRCUIT HAVING REDUNDANT THROUGH SILIC...

STACKED MEMORY DEVICE USING BASE DIE SPARE CELL AND METHOD OF REPAI...

THREE-DIMENSIONAL INTEGRATED CIRCUIT

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SURFACE TREATMEN...

PLASMA TREATING APPARATUS, SUBSTRATE TREATING METHOD, AND METHOD OF...

SEMICONDUCTOR DEVICE INCLUDING A GLOBAL BUFFER SHARED BY A PLURALIT...

SEMICONDUCTOR DEVICE AND METHOD FOR TESTING THE SAME

PLASMA TREATING APPARATUS, SUBSTRATE TREATING METHOD, AND METHOD OF...

METHOD OF GENERATING VOLTAGE ISLAND FOR 3D MANY-CORE CHIP MULTIPROC...

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SURFACE TREATMEN...

METHOD AND DEVICE FOR REPAIRING MEMORY

MULTI-CORE DEVICE, TEST DEVICE, AND METHOD OF DIAGNOSING FAILURE