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Sungjun Lee
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Daejeon, KR
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last 30 patents
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Patent Grant
Thermocouple wafer calibration system and calibration method using...
Patent number
12,050,140
Issue date
Jul 30, 2024
KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
Yong-Gyoo Kim
G01 - MEASURING TESTING
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Patent Grant
Flexible force or pressure sensor array using semiconductor strain...
Patent number
8,695,441
Issue date
Apr 15, 2014
Korea Research Institute of Standards and Science
Min Seok Kim
G01 - MEASURING TESTING
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last 30 patents
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FLEXIBLE FORCE OR PRESSURE SENSOR ARRAY USING SEMICONDUCTOR STRAIN...
Publication number
20110226069
Publication date
Sep 22, 2011
Korea Research Institute of Standards and Science
Min Seok Kim
G01 - MEASURING TESTING