Sungseo Cho

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Sturbridge, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Metrology of bilayer photoresist processes
- Patent number 7,901,852
- Issue date Mar 8, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Cesar M. Garza
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Metrology of bilayer photoresist processes
- Publication number 20090220895
- Publication date Sep 3, 2009
- Freescale Semiconductor, Inc.
- Cesar M. Garza
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY