Sunhong JUN

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Dual resolution spectrometer, and spectrometric measurement apparat...
- Patent number 12,332,164
- Issue date Jun 17, 2025
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system including reference specimen and method of formin...
- Patent number 11,921,270
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Sungil Choi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND...
- Publication number 20250076116
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL MEASUREMENT SYSTEM AND METHOD
- Publication number 20250003734
- Publication date Jan 2, 2025
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME
- Publication number 20240295490
- Publication date Sep 5, 2024
- Samsung Electronics Co., Ltd.
- Jaeho Kim
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Publication number 20240255439
- Publication date Aug 1, 2024
- Samsung Electronics Co., Ltd.
- Heeyoon Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER
- Publication number 20240234216
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20240230528
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Sunhong Jun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER
- Publication number 20240136232
- Publication date Apr 25, 2024
- Samsung Electronics Co., Ltd.
- Inkeun BAEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARAT...
- Publication number 20240035957
- Publication date Feb 1, 2024
- Samsung Electronics Co., Ltd.
- Sunhong JUN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMIN...
- Publication number 20230008686
- Publication date Jan 12, 2023
- Samsung Electronics Co., Ltd.
- Sungil Choi
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME
- Publication number 20200182783
- Publication date Jun 11, 2020
- Samsung Electronics Co., Ltd.
- Sunhong JUN
- G01 - MEASURING TESTING

Sunhong JUN

Person

Patents Grantslast 30 patents

Dual resolution spectrometer, and spectrometric measurement apparat...

Inspection system including reference specimen and method of formin...

Patents Applicationslast 30 patents

OPTICAL MODULE, SPECTROSCOPIC DEVICE FOR HYPERSPECTRAL IMAGING, AND...

MATERIAL MEASUREMENT SYSTEM AND METHOD

MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME

DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD

METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER

TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD

METHOD OF EXTRACTING PROPERTIES OF A LAYER ON A WAFER

DUAL RESOLUTION SPECTROMETER, AND SPECTROMETRIC MEASUREMENT APPARAT...

INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMIN...

MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME