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last 30 patents
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Patent Grant
Inspection system including reference specimen and method of formin...
Patent number
11,921,270
Issue date
Mar 5, 2024
Samsung Electronics Co., Ltd.
Sungil Choi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMIN...
Publication number
20230008686
Publication date
Jan 12, 2023
Samsung Electronics Co., Ltd.
Sungil Choi
G01 - MEASURING TESTING
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Patent Application
MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME
Publication number
20200182783
Publication date
Jun 11, 2020
Samsung Electronics Co., Ltd.
Sunhong JUN
G01 - MEASURING TESTING