Sunil K. Jain

Person

Portand, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Providing timing information over a data link
- Patent number 10,045,011
- Issue date Aug 7, 2018
- Intel Corporation
- Paul Winer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for making intelligent use of active space in...
- Patent number 9,641,824
- Issue date May 2, 2017
- Intel Corporation
- Sunil K. Jain
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
2D quality enhancer in polarized 3D systems for 2D-3D co-existence
- Patent number 9,261,710
- Issue date Feb 16, 2016
- Intel Corporation
- Sunil K. Jain
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for adaptive stable image timing in stereoscop...
- Patent number 9,143,767
- Issue date Sep 22, 2015
- Intel Corporation
- Sunil K. Jain
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparaus for making intelligent use of active space in f...
- Patent number 8,842,170
- Issue date Sep 23, 2014
- Intel Corporation
- Sunil K. Jain
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Techniques for adapting a color gamut
- Patent number 8,654,141
- Issue date Feb 18, 2014
- Intel Corporation
- Yanli Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Flexible head probe for sort interface units
- Patent number 7,474,113
- Issue date Jan 6, 2009
- Intel Corporation
- Sunil K Jain
- G01 - MEASURING TESTING
Information Patent Grant
Eye width characterization mechanism
- Patent number 7,337,380
- Issue date Feb 26, 2008
- Intel Corporation
- Kim Kee Chow
- G01 - MEASURING TESTING
Information Patent Grant
Virtual test environment
- Patent number 7,324,932
- Issue date Jan 29, 2008
- Intel Corporation
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Grant
Eye width characterization mechanism
- Patent number 7,225,370
- Issue date May 29, 2007
- Intel Corporation
- Kim Kee Chow
- G01 - MEASURING TESTING
Information Patent Grant
Virtual test environment
- Patent number 6,934,670
- Issue date Aug 23, 2005
- Intel Corporation
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for testing a serial differential/mixed sig...
- Patent number 6,898,746
- Issue date May 24, 2005
- Intel Corporation
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for measuring the correctness of and correc...
- Patent number 6,829,553
- Issue date Dec 7, 2004
- Intel Corporation
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating and correcting the tester derat...
- Patent number 6,665,627
- Issue date Dec 16, 2003
- Intel Corporation
- Sunil K. Jain
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR MAKING INTELLIGENT USE OF ACTIVE SPACE IN...
- Publication number 20170034498
- Publication date Feb 2, 2017
- Intel Corporation
- Sunil K. Jain
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR MAKING INTELLIGENT USE OF ACTIVE SPACE IN...
- Publication number 20140375766
- Publication date Dec 25, 2014
- Sunil K. Jain
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PROVIDING TIMING INFORMATION OVER A DATA LINK
- Publication number 20140267634
- Publication date Sep 18, 2014
- Paul Winer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MECHANISM FOR EMPLOYING AND FACILITATING A UNIVERSAL AND DYNAMIC EY...
- Publication number 20130083392
- Publication date Apr 4, 2013
- SUNIL K. JAIN
- G02 - OPTICS
Information Patent Application
2D QUALITY ENHANCER IN POLARIZED 3D SYSTEMS FOR 2D-3D CO-EXISTENCE
- Publication number 20120002279
- Publication date Jan 5, 2012
- SUNIL K. JAIN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
STEREOSCOPIC 3D CONTENT AUTO-FORMAT-ADAPTER MIDDLEWARE FOR STREAMIN...
- Publication number 20110320941
- Publication date Dec 29, 2011
- SUNIL K. JAIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARAUS FOR MAKING INTELLIGENT USE OF ACTIVE SPACE IN F...
- Publication number 20110292170
- Publication date Dec 1, 2011
- SUNIL K. JAIN
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARAUS FOR ADAPTIVE STABLE IMAGE TIMING IN STEREOSCOPI...
- Publication number 20110292169
- Publication date Dec 1, 2011
- Sunil K. Jain
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Techniques for adapting a color gamut
- Publication number 20110157212
- Publication date Jun 30, 2011
- Yanli Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Eye width characterization mechanism
- Publication number 20070277063
- Publication date Nov 29, 2007
- Kim Kee Chow
- G01 - MEASURING TESTING
Information Patent Application
Eye width characterization mechanism
- Publication number 20060048030
- Publication date Mar 2, 2006
- Kim Kee Chow
- G01 - MEASURING TESTING
Information Patent Application
Virtual test environment
- Publication number 20050240389
- Publication date Oct 27, 2005
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Application
Flexible head probe for sort interface units
- Publication number 20040080329
- Publication date Apr 29, 2004
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Application
Direct landing technology for wafer probe
- Publication number 20030234660
- Publication date Dec 25, 2003
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for testing a serial differential/mixed sig...
- Publication number 20020194560
- Publication date Dec 19, 2002
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Application
Method of and apparatus for measuring the correctness of and correc...
- Publication number 20020144197
- Publication date Oct 3, 2002
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for evaluating and correcting the tester derat...
- Publication number 20020143486
- Publication date Oct 3, 2002
- Sunil K. Jain
- G01 - MEASURING TESTING
Information Patent Application
Virtual test environment
- Publication number 20020143519
- Publication date Oct 3, 2002
- Sunil K. Jain
- G01 - MEASURING TESTING

Sunil K. Jain

Person

Patents Grantslast 30 patents

Providing timing information over a data link

Method and apparatus for making intelligent use of active space in...

2D quality enhancer in polarized 3D systems for 2D-3D co-existence

Method and apparatus for adaptive stable image timing in stereoscop...

Method and apparaus for making intelligent use of active space in f...

Techniques for adapting a color gamut

Flexible head probe for sort interface units

Eye width characterization mechanism

Virtual test environment

Eye width characterization mechanism

Virtual test environment

Method of and apparatus for testing a serial differential/mixed sig...

Method of and apparatus for measuring the correctness of and correc...

Method and apparatus for evaluating and correcting the tester derat...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR MAKING INTELLIGENT USE OF ACTIVE SPACE IN...

METHOD AND APPARATUS FOR MAKING INTELLIGENT USE OF ACTIVE SPACE IN...

PROVIDING TIMING INFORMATION OVER A DATA LINK

MECHANISM FOR EMPLOYING AND FACILITATING A UNIVERSAL AND DYNAMIC EY...

2D QUALITY ENHANCER IN POLARIZED 3D SYSTEMS FOR 2D-3D CO-EXISTENCE

STEREOSCOPIC 3D CONTENT AUTO-FORMAT-ADAPTER MIDDLEWARE FOR STREAMIN...

METHOD AND APPARAUS FOR MAKING INTELLIGENT USE OF ACTIVE SPACE IN F...

METHOD AND APPARAUS FOR ADAPTIVE STABLE IMAGE TIMING IN STEREOSCOPI...

Techniques for adapting a color gamut

Eye width characterization mechanism

Eye width characterization mechanism

Virtual test environment

Flexible head probe for sort interface units

Direct landing technology for wafer probe

Method of and apparatus for testing a serial differential/mixed sig...

Method of and apparatus for measuring the correctness of and correc...

Method and apparatus for evaluating and correcting the tester derat...

Virtual test environment