Surendra K. Bommu

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Plansboro, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Segmented compaction with pruning and critical fault elimination
- Patent number 6,467,058
- Issue date Oct 15, 2002
- NEC USA, Inc.
- Srimat T. Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
On-line partitioning for sequential circuit test generation
- Patent number 6,378,096
- Issue date Apr 23, 2002
- NEC USA, Inc.
- Srimat T. Chakradhar
- G01 - MEASURING TESTING
Information Patent Grant
Vector restoration using accelerated validation and refinement
- Patent number 6,223,316
- Issue date Apr 24, 2001
- NEC USA, Inc.
- Surendra K. Bommu
- G01 - MEASURING TESTING
Information Patent Grant
Static test sequence compaction using two-phase restoration and seg...
- Patent number 5,987,636
- Issue date Nov 16, 1999
- NEC USA, Inc.
- Surendra K. Bommu
- G01 - MEASURING TESTING