Surendra Singh SRIVASTAVA

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Temperature profile measurement and synchronized control on substra...
- Patent number 12,196,617
- Issue date Jan 14, 2025
- Applied Materials, Inc.
- Zuoming Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Substrate processing monitoring
- Patent number 12,165,934
- Issue date Dec 10, 2024
- Applied Materials, Inc.
- Zuoming Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for foreline deposition diagnostics and control
- Patent number 11,860,973
- Issue date Jan 2, 2024
- Applied Materials, Inc.
- Ala Moradian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rapid chamber vacuum leak check hardware and maintenance routine
- Patent number 11,635,338
- Issue date Apr 25, 2023
- Applied Materials, Inc.
- Martin A. Hilkene
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE PROFILE MEASUREMENT AND SYNCHRONIZED CONTROL ON SUBSTRA...
- Publication number 20250231066
- Publication date Jul 17, 2025
- Applied Materials, Inc.
- Zuoming ZHU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING MONITORING
- Publication number 20250096045
- Publication date Mar 20, 2025
- Applied Materials, Inc.
- Zuoming ZHU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUSCEPTOR FOR PROCESS CHAMBER
- Publication number 20240339352
- Publication date Oct 10, 2024
- Applied Materials, Inc.
- Zhepeng CONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR DETECTION USING OPTICAL EMISSION SPECTROSCOPY
- Publication number 20220283029
- Publication date Sep 8, 2022
- Applied Materials, Inc.
- Zuoming ZHU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
TEMPERATURE PROFILE MEASUREMENT AND SYNCHRONIZED CONTROL ON SUBSTRA...
- Publication number 20220155148
- Publication date May 19, 2022
- Applied Materials, Inc.
- Zuoming ZHU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RAPID CHAMBER VACUUM LEAK CHECK HARDWARE AND MAINTENANCE ROUTINE
- Publication number 20220128425
- Publication date Apr 28, 2022
- Applied Materials, Inc.
- Martin A. HILKENE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR FORELINE DEPOSITION DIAGNOSTICS AND CONTROL
- Publication number 20220129698
- Publication date Apr 28, 2022
- Applied Materials, Inc.
- Ala MORADIAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE PROCESSING MONITORING
- Publication number 20210028075
- Publication date Jan 28, 2021
- Applied Materials, Inc.
- Zuoming ZHU
- H01 - BASIC ELECTRIC ELEMENTS

Surendra Singh SRIVASTAVA

Person

Patents Grantslast 30 patents

Temperature profile measurement and synchronized control on substra...

Substrate processing monitoring

Method and system for foreline deposition diagnostics and control

Rapid chamber vacuum leak check hardware and maintenance routine

Patents Applicationslast 30 patents

TEMPERATURE PROFILE MEASUREMENT AND SYNCHRONIZED CONTROL ON SUBSTRA...

SUBSTRATE PROCESSING MONITORING

SUSCEPTOR FOR PROCESS CHAMBER

METHODS FOR DETECTION USING OPTICAL EMISSION SPECTROSCOPY

TEMPERATURE PROFILE MEASUREMENT AND SYNCHRONIZED CONTROL ON SUBSTRA...

RAPID CHAMBER VACUUM LEAK CHECK HARDWARE AND MAINTENANCE ROUTINE

METHOD AND SYSTEM FOR FORELINE DEPOSITION DIAGNOSTICS AND CONTROL

SUBSTRATE PROCESSING MONITORING