Suresh SUBRAMANIAM

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Richardson, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor outlier identification using serially-combined data t...
- Patent number 8,126,681
- Issue date Feb 28, 2012
- Texas Instruments Incorporated
- Amit V Nahar
- G01 - MEASURING TESTING
Information Patent Grant
Identification of outlier semiconductor devices using data-driven s...
- Patent number 7,494,829
- Issue date Feb 24, 2009
- Texas Instruments Incorporated
- Suresh Subramaniam
- G01 - MEASURING TESTING
Information Patent Grant
Method for test data-driven statistical detection of outlier semico...
- Patent number 7,129,735
- Issue date Oct 31, 2006
- Texas Instruments Incorporated
- Suresh Subramaniam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR OUTLIER IDENTIFICATION USING SERIALLY-COMBINED DATA T...
- Publication number 20110071782
- Publication date Mar 24, 2011
- TEXAS INSTRUMENTS INCORPORATED
- AMIT V. NAHAR
- G01 - MEASURING TESTING
Information Patent Application
Identification of Outlier Semiconductor Devices Using Data-Driven S...
- Publication number 20080262793
- Publication date Oct 23, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Suresh SUBRAMANIAM
- G01 - MEASURING TESTING
Information Patent Application
Method for test data-driven statistical detection of outlier semico...
- Publication number 20060028229
- Publication date Feb 9, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Suresh Subramaniam
- G01 - MEASURING TESTING