Suresh Uppal

Person

Clifton Park, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of post-process dispensation of plasma induced damage prote...
- Patent number 10,181,713
- Issue date Jan 15, 2019
- GLOBALFOUNDRIES Inc.
- Arnaud Bousquet
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
OTPROM for post-process programming using selective breakdown
- Patent number 10,147,496
- Issue date Dec 4, 2018
- GLOBALFOUNDRIES Inc.
- Akhilesh Gautam
- G11 - INFORMATION STORAGE
Information Patent Grant
Thermal oxide equivalent low temperature ALD oxide for dual purpose...
- Patent number 10,106,892
- Issue date Oct 23, 2018
- GLOBALFOUNDRIES Inc.
- Shahab Siddiqui
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Methods, apparatus and system for screening process splits for tech...
- Patent number 10,054,630
- Issue date Aug 21, 2018
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Methods, apparatus and system for TDDB testing
- Patent number 10,012,687
- Issue date Jul 3, 2018
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G11 - INFORMATION STORAGE
Information Patent Grant
OTPROM for post-process programming using selective breakdown
- Patent number 9,916,903
- Issue date Mar 13, 2018
- GLOBALFOUNDRIES Inc.
- Akhilesh Gautam
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods, apparatus and system for screening process splits for tech...
- Patent number 9,702,926
- Issue date Jul 11, 2017
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Methods, apparatus and system for voltage ramp testing
- Patent number 9,599,656
- Issue date Mar 21, 2017
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure having test device
- Patent number 9,500,703
- Issue date Nov 22, 2016
- GLOBALFOUNDRIES Inc.
- Anil Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Method for creating an OTPROM array possessing multi-bit capacity w...
- Patent number 9,460,806
- Issue date Oct 4, 2016
- GLOBALFOUNDRIES Inc.
- Akhilesh Gautam
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer test structures and methods of providing wafer test structures
- Patent number 9,372,226
- Issue date Jun 21, 2016
- GLOBALFOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Grant
Gate dielectric protection for transistors
- Patent number 9,324,822
- Issue date Apr 26, 2016
- GLOBALFOUNDRIES Inc.
- Andreas Kerber
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NOVEL OTPROM FOR POST-PROCESS PROGRAMMING USING SELECTIVE BREAKDOWN
- Publication number 20180151238
- Publication date May 31, 2018
- GLOBALFOUNDRIES INC.
- Akhilesh Gautam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...
- Publication number 20170292986
- Publication date Oct 12, 2017
- GLOBALFOUNDRIES, Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
GATE DIELECTRIC PROTECTION FOR TRANSISTORS
- Publication number 20160204098
- Publication date Jul 14, 2016
- GLOBALFOUNDRIES INC.
- Andreas Kerber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CREATING AN OTPROM ARRAY POSSESSING MULTI-BIT CAPACITY W...
- Publication number 20160163398
- Publication date Jun 9, 2016
- GLOBALFOUNDRIES INC.
- Akhilesh GAUTAM
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR VOLTAGE RAMP TESTING
- Publication number 20160146879
- Publication date May 26, 2016
- GLOBAL FOUNDRIES Inc.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF POST-PROCESS DISPENSATION OF PLASMA INDUCED DAMAGE PROTE...
- Publication number 20160111867
- Publication date Apr 21, 2016
- GLOBALFOUNDRIES, Inc.
- Arnaud Bousquet
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
NOVEL OTPROM FOR POST-PROCESS PROGRAMMING USING SELECTIVE BREAKDOWN
- Publication number 20160104541
- Publication date Apr 14, 2016
- GLOBALFOUNDRIES INC.
- Akhilesh Gautam
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR TDDB TESTING
- Publication number 20160061880
- Publication date Mar 3, 2016
- GLOBALFOUNDRIES INC.
- Suresh Uppal
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR STRUCTURE HAVING TEST DEVICE
- Publication number 20160054383
- Publication date Feb 25, 2016
- GLOBALFOUNDRIES INC.
- Anil KUMAR
- G01 - MEASURING TESTING
Information Patent Application
WAFER TEST STRUCTURES AND METHODS OF PROVIDING WAFER TEST STRUCTURES
- Publication number 20160025805
- Publication date Jan 28, 2016
- GLOBALFOUNDRIES INC.
- Suresh UPPAL
- G01 - MEASURING TESTING
Information Patent Application
GATE DIELECTRIC PROTECTION FOR TRANSISTORS
- Publication number 20160005828
- Publication date Jan 7, 2016
- GLOBALFOUNDRIES INC.
- Andreas Kerber
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INLINE DEVICE CHARACTERIZATION AND TEMPERA...
- Publication number 20150377956
- Publication date Dec 31, 2015
- GLOBALFOUNDRIES INC.
- William MCMAHON
- G01 - MEASURING TESTING
Information Patent Application
METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...
- Publication number 20150346271
- Publication date Dec 3, 2015
- GLOBALFOUNDRIES INC.
- Suresh Uppal
- G01 - MEASURING TESTING

Suresh Uppal

Person

Patents Grantslast 30 patents

Methods of post-process dispensation of plasma induced damage prote...

OTPROM for post-process programming using selective breakdown

Thermal oxide equivalent low temperature ALD oxide for dual purpose...

Methods, apparatus and system for screening process splits for tech...

Methods, apparatus and system for TDDB testing

OTPROM for post-process programming using selective breakdown

Methods, apparatus and system for screening process splits for tech...

Methods, apparatus and system for voltage ramp testing

Semiconductor structure having test device

Method for creating an OTPROM array possessing multi-bit capacity w...

Wafer test structures and methods of providing wafer test structures

Gate dielectric protection for transistors

Patents Applicationslast 30 patents

NOVEL OTPROM FOR POST-PROCESS PROGRAMMING USING SELECTIVE BREAKDOWN

METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...

GATE DIELECTRIC PROTECTION FOR TRANSISTORS

METHOD FOR CREATING AN OTPROM ARRAY POSSESSING MULTI-BIT CAPACITY W...

METHODS, APPARATUS AND SYSTEM FOR VOLTAGE RAMP TESTING

METHODS OF POST-PROCESS DISPENSATION OF PLASMA INDUCED DAMAGE PROTE...

NOVEL OTPROM FOR POST-PROCESS PROGRAMMING USING SELECTIVE BREAKDOWN

METHODS, APPARATUS AND SYSTEM FOR TDDB TESTING

SEMICONDUCTOR STRUCTURE HAVING TEST DEVICE

WAFER TEST STRUCTURES AND METHODS OF PROVIDING WAFER TEST STRUCTURES

GATE DIELECTRIC PROTECTION FOR TRANSISTORS

METHOD AND APPARATUS FOR INLINE DEVICE CHARACTERIZATION AND TEMPERA...

METHODS, APPARATUS AND SYSTEM FOR SCREENING PROCESS SPLITS FOR TECH...