Waxhaw, NC, US
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Patent Grant
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G01 - MEASURING TESTING
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Patent Application
Honeywell International Inc.
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G01 - MEASURING TESTING
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Patent Application
Hand Held Products, Inc.
Chen Feng
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Hand Held Products, Inc.
Suresh VENKATARAYALU
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Hand Held Products, Inc.
Suresh VENKATARAYALU
G01 - MEASURING TESTING
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Patent Application
Hand Held Products, Inc.
Suresh VENKATARAYALU
G01 - MEASURING TESTING
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Patent Application
Hand Held Products, Inc.
Ronald W. Myers
G01 - MEASURING TESTING
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Patent Application
Hand Held Products, Inc.
Chen FENG
G01 - MEASURING TESTING
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Patent Application
Hand Held Products, Inc.
Adam Dewey MCBRADY
G01 - MEASURING TESTING
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Patent Application
Hand Held Products, Inc.
Chen FENG
G01 - MEASURING TESTING
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Patent Application
Hand Held Products, Inc.
Chen FENG
G01 - MEASURING TESTING
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Patent Application
Hand Held Products, Inc.
Suresh VENKATARAYALU
G01 - MEASURING TESTING
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Patent Application
REBELLION PHOTONICS, INC.
Thomas A. ISBERG
G01 - MEASURING TESTING
