San Diego, CA, US
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Sergio A Montoya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Benjamin Taylor
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
United States Government as represented by the Secretary of the Navy
Anna Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Anna Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
United States of America as represented by Secretary of the Navy
Benjamin J Taylor
G01 - MEASURING TESTING
Information
Patent Grant
Benjamin J. Taylor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
The United States of America as represented by the Secretary of the Navy
Anna M. Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America, as represented by the Secretary of the Navy
Anna M. Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America, as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Grant
The United States of America as represented by the Secretary of the Navy
Benjamin J. Taylor
B82 - NANO-TECHNOLOGY
Information
Patent Grant
The United States of America as represented by Secretary of the Navy
Susan Anne Elizabeth Berggren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
The United States of America as represented by Secretary of the Navy
Benjamin J. Taylor
G02 - OPTICS
Information
Patent Grant
The United States of America, as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Application
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Sergio A. Montoya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
The United States of America as represented by the Secretary of the Navy
Benjamin Taylor
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
United States Government as represented by the Secretary of the Navy
Anna Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Application
United States Governmnet as represented by the Secretary of the Navy
Anna Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
The United States of America, as represented by the Secretary of the Navy
BENJAMIN J. TAYLOR
G01 - MEASURING TESTING
Information
Patent Application
United States of America as represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Application
United States of America as represented by Secretary of the Navy
Anna M. Leese de Escobar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
United States of America, as Represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Application
United States of America, as Represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
Information
Patent Application
United States of America, as Represented by the Secretary of the Navy
Anna M. Leese de Escobar
G01 - MEASURING TESTING
Information
Patent Application
United States of America, as Represented by the Secretary of the Navy
Susan Anne Elizabeth Berggren
G01 - MEASURING TESTING
