Susan G. Conti

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Hopewell Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Predicting wafer failure using learned probability
- Patent number 7,962,302
- Issue date Jun 14, 2011
- International Business Machines Corporation
- Robert Jeffrey Baseman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Predicting Wafer Failure Using Learned Probability
- Publication number 20100145646
- Publication date Jun 10, 2010
- Robert Jeffrey Baseman
- H01 - BASIC ELECTRIC ELEMENTS