Susumu Asada

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining an impurity concentration profile
- Patent number 5,652,151
- Issue date Jul 29, 1997
- NEC Corporation
- Susumu Asada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor multilayer reflector and light emitting device with t...
- Patent number 5,237,581
- Issue date Aug 17, 1993
- NEC Corporation
- Susumu Asada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor light emitting device with luminescent layer sandwich...
- Patent number 5,216,685
- Issue date Jun 1, 1993
- NEC Corporation
- Susumu Asada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming thin films by absorption
- Patent number 4,605,566
- Issue date Aug 12, 1986
- NEC Corporation
- Shinji Matsui
- H01 - BASIC ELECTRIC ELEMENTS