Susumu Asanuma

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Hamamatsu-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection master
- Patent number 11,781,849
- Issue date Oct 10, 2023
- Asanuma Giken Co., Ltd.
- Susumu Asanuma
- G01 - MEASURING TESTING
Information Patent Grant
Inspection master
- Patent number 11,293,745
- Issue date Apr 5, 2022
- Asanuma Giken Co., Ltd.
- Susumu Asanuma
- G01 - MEASURING TESTING
Information Patent Grant
Inspection master block and method of producing the same
- Patent number 6,782,730
- Issue date Aug 31, 2004
- Asanuma Giken Co., Ltd.
- Susumu Asanuma
- G01 - MEASURING TESTING
Information Patent Grant
Transfer apparatus of testing master block for measuring machine
- Patent number 6,601,310
- Issue date Aug 5, 2003
- Asanuma Giken Co., Ltd.
- Susumu Asanuma
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating measurement error in coordinate measuring mac...
- Patent number 6,513,253
- Issue date Feb 4, 2003
- National Institute of Advanced Industrial Science and Technology, Ministry of...
- Jiro Matsuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION MASTER
- Publication number 20220221261
- Publication date Jul 14, 2022
- ASANUMA GIKEN CO., LTD.
- Susumu ASANUMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION MASTER
- Publication number 20210223020
- Publication date Jul 22, 2021
- ASANUMA GIKEN CO., LTD.
- Susumu ASANUMA
- G01 - MEASURING TESTING
Information Patent Application
Inspection master block and method of producing the same
- Publication number 20020157449
- Publication date Oct 31, 2002
- Susumu Asanuma
- G01 - MEASURING TESTING
Information Patent Application
Setting device for measuring instrument-inspecting measurement master
- Publication number 20020152624
- Publication date Oct 24, 2002
- Susumu Asanuma
- G01 - MEASURING TESTING
Information Patent Application
Method for evaluating measurement error in coordinate measuring mac...
- Publication number 20010045021
- Publication date Nov 29, 2001
- Jiro Matsuda
- G01 - MEASURING TESTING