Susumu Kasukabe

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card, semiconductor inspecting apparatus, and manufacturing m...
- Patent number 8,314,624
- Issue date Nov 20, 2012
- Renesas Electronics Corporation
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Probe card, semiconductor inspecting apparatus, and manufacturing m...
- Patent number 7,956,627
- Issue date Jun 7, 2011
- Renesas Electronics Corporation
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Probe card, manufacturing method of probe card, semiconductor inspe...
- Patent number 7,724,006
- Issue date May 25, 2010
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Probe cassette, semiconductor inspection apparatus and manufacturin...
- Patent number 7,656,174
- Issue date Feb 2, 2010
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Connection device and test system
- Patent number 7,541,202
- Issue date Jun 2, 2009
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of semiconductor integrated circuit device
- Patent number 7,534,629
- Issue date May 19, 2009
- Renesas Technology Corp.
- Teruo Shoji
- G01 - MEASURING TESTING
Information Patent Grant
Probe sheet adhesion holder, probe card, semiconductor test device,...
- Patent number 7,423,439
- Issue date Sep 9, 2008
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and semiconductor testing device using probe sheet or pr...
- Patent number 7,420,380
- Issue date Sep 2, 2008
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a semiconductor device with pyramidal bump ele...
- Patent number 7,390,732
- Issue date Jun 24, 2008
- Hitachi, Ltd.
- Takayoshi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,351,597
- Issue date Apr 1, 2008
- Renesas Technology Corp.
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Grant
Connection device and test system
- Patent number 7,285,430
- Issue date Oct 23, 2007
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection apparatus and manufacturing method of semi...
- Patent number 7,227,370
- Issue date Jun 5, 2007
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Fabrication method of semiconductor integrated circuit device
- Patent number 7,219,422
- Issue date May 22, 2007
- Renesas Technology Corp.
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 7,198,962
- Issue date Apr 3, 2007
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Probe sheet, probe card, semiconductor test equipment and semicondu...
- Patent number 7,049,837
- Issue date May 23, 2006
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Probing device and manufacturing method thereof, as well as testing...
- Patent number 6,900,646
- Issue date May 31, 2005
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Connection device and test system
- Patent number 6,759,258
- Issue date Jul 6, 2004
- Renesas Technology Corp.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Probing device and manufacturing method thereof, as well as testing...
- Patent number 6,617,863
- Issue date Sep 9, 2003
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,566,150
- Issue date May 20, 2003
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,455,335
- Issue date Sep 24, 2002
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Connector and probing system
- Patent number 6,305,230
- Issue date Oct 23, 2001
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method thereof including a p...
- Patent number 6,197,603
- Issue date Mar 6, 2001
- Hitachi, Ltd.
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method of a probe head for semiconductor LSI inspecti...
- Patent number 5,191,708
- Issue date Mar 9, 1993
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing probing head for testing equipment of semi-...
- Patent number 4,952,272
- Issue date Aug 28, 1990
- Hitachi, Ltd.
- Hironobu Okino
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing semiconductor device
- Patent number 4,931,726
- Issue date Jun 5, 1990
- Hitachi, Ltd.
- Susumu Kasukabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD, SEMICONDUCTOR INSPECTING APPARATUS, AND MANUFACTURING M...
- Publication number 20110169518
- Publication date Jul 14, 2011
- RENESAS ELECTRONICS CORPORATION
- Susumu KASUKABE
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM PROBE SHEET AND SEMICONDUCTOR CHIP INSPECTION SYSTEM
- Publication number 20110014727
- Publication date Jan 20, 2011
- Akira Yabushita
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, MANUFACTURING METHOD OF PROBE CARD, SEMICONDUCTOR INSPE...
- Publication number 20090212798
- Publication date Aug 27, 2009
- Susumu KASUKABE
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION DEVICE AND TEST SYSTEM
- Publication number 20090209053
- Publication date Aug 20, 2009
- Susumu KASUKABE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, SEMICONDUCTOR INSPECTING APPARATUS, AND MANUFACTURING M...
- Publication number 20090042323
- Publication date Feb 12, 2009
- Susumu KASUKABE
- G01 - MEASURING TESTING
Information Patent Application
Transmission Circuit, Connecting Sheet, Probe Sheet, Probe Card, Se...
- Publication number 20080029763
- Publication date Feb 7, 2008
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
CONNECTION DEVICE AND TEST SYSTEM
- Publication number 20080009082
- Publication date Jan 10, 2008
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Probe Cassette, Semiconductor Inspection Apparatus And Manufacturin...
- Publication number 20070279074
- Publication date Dec 6, 2007
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20070218572
- Publication date Sep 20, 2007
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
Probe sheet adhesion holder, probe card, semiconductor test device,...
- Publication number 20070103178
- Publication date May 10, 2007
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Probe card and semiconductor testing device using probe sheet or pr...
- Publication number 20060192575
- Publication date Aug 31, 2006
- Hitachi, Ltd
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor inspection apparatus and manufacturing method of semi...
- Publication number 20060139042
- Publication date Jun 29, 2006
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Thin film probe sheet and semiconductor chip inspection system
- Publication number 20060094162
- Publication date May 4, 2006
- Akira Yabushita
- G01 - MEASURING TESTING
Information Patent Application
Connection device and test system
- Publication number 20040235207
- Publication date Nov 25, 2004
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Fabrication method of semiconductor integrated circuit device
- Publication number 20040183556
- Publication date Sep 23, 2004
- Yuji Wada
- G01 - MEASURING TESTING
Information Patent Application
Probe sheet, probe card, semiconductor test equipment and semicondu...
- Publication number 20040070413
- Publication date Apr 15, 2004
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20030203521
- Publication date Oct 30, 2003
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and manufacturing method thereof including a p...
- Publication number 20020182796
- Publication date Dec 5, 2002
- Ryuji Kohno
- G01 - MEASURING TESTING
Information Patent Application
Probing device and manufacturing method thereof, as well as testing...
- Publication number 20020135387
- Publication date Sep 26, 2002
- Susumu Kasukabe
- G01 - MEASURING TESTING
Information Patent Application
Connection device and test system
- Publication number 20020129323
- Publication date Sep 12, 2002
- Susumu Kasukabe
- G01 - MEASURING TESTING

Susumu Kasukabe

Person

Patents Grantslast 30 patents

Probe card, semiconductor inspecting apparatus, and manufacturing m...

Probe card, semiconductor inspecting apparatus, and manufacturing m...

Probe card, manufacturing method of probe card, semiconductor inspe...

Probe cassette, semiconductor inspection apparatus and manufacturin...

Connection device and test system

Manufacturing method of semiconductor integrated circuit device

Probe sheet adhesion holder, probe card, semiconductor test device,...

Probe card and semiconductor testing device using probe sheet or pr...

Method for producing a semiconductor device with pyramidal bump ele...

Fabrication method of semiconductor integrated circuit device

Connection device and test system

Semiconductor inspection apparatus and manufacturing method of semi...

Fabrication method of semiconductor integrated circuit device

Semiconductor device and manufacturing method thereof including a p...

Probe sheet, probe card, semiconductor test equipment and semicondu...

Probing device and manufacturing method thereof, as well as testing...

Connection device and test system

Probing device and manufacturing method thereof, as well as testing...

Semiconductor device and manufacturing method thereof including a p...

Semiconductor device and manufacturing method thereof including a p...

Connector and probing system

Semiconductor device and manufacturing method thereof including a p...

Manufacturing method of a probe head for semiconductor LSI inspecti...

Method of manufacturing probing head for testing equipment of semi-...

Apparatus for testing semiconductor device

Patents Applicationslast 30 patents

PROBE CARD, SEMICONDUCTOR INSPECTING APPARATUS, AND MANUFACTURING M...

THIN FILM PROBE SHEET AND SEMICONDUCTOR CHIP INSPECTION SYSTEM

PROBE CARD, MANUFACTURING METHOD OF PROBE CARD, SEMICONDUCTOR INSPE...

CONNECTION DEVICE AND TEST SYSTEM

PROBE CARD, SEMICONDUCTOR INSPECTING APPARATUS, AND MANUFACTURING M...

Transmission Circuit, Connecting Sheet, Probe Sheet, Probe Card, Se...

CONNECTION DEVICE AND TEST SYSTEM

Probe Cassette, Semiconductor Inspection Apparatus And Manufacturin...

FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

Probe sheet adhesion holder, probe card, semiconductor test device,...

Probe card and semiconductor testing device using probe sheet or pr...

Semiconductor inspection apparatus and manufacturing method of semi...

Thin film probe sheet and semiconductor chip inspection system

Connection device and test system

Fabrication method of semiconductor integrated circuit device

Probe sheet, probe card, semiconductor test equipment and semicondu...

Semiconductor device and manufacturing method thereof including a p...

Semiconductor device and manufacturing method thereof including a p...

Probing device and manufacturing method thereof, as well as testing...

Connection device and test system