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Susumu Sakairi

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,927,032
    • Issue date Mar 12, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,913,966
    • Issue date Feb 27, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Susumu Sakairi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,686,741
    • Issue date Jun 27, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takenori Okusa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,915,672
    • Issue date Mar 13, 2018
    • Roche Diagnostics Operations, Inc.
    • Reinhold Kraemer
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,678,093
    • Issue date Jun 13, 2017
    • Hitachi High-Technologies Corporation
    • Susumu Sakairi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automated analyzer
    • Patent number 9,664,675
    • Issue date May 30, 2017
    • Hitachi High-Technologies Corporation
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,274,133
    • Issue date Mar 1, 2016
    • Roche Diagnostics Operations, Inc.
    • Reinhold Kraemer
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 9,244,088
    • Issue date Jan 26, 2016
    • Hitachi High-Technologies Corporation
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,916,096
    • Issue date Dec 23, 2014
    • Hitachi High-Technologies Corporation
    • Yukinori Sakashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 8,753,572
    • Issue date Jun 17, 2014
    • Hitachi High-Technologies Corporation
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer and device for opening/closing the lids of reage...
    • Patent number 8,703,056
    • Issue date Apr 22, 2014
    • Hitachi High-Technologies Corporation
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Main part for immunity analysis machine
    • Patent number D523153
    • Issue date Jun 13, 2006
    • Hitachi High-Technologies Corporation
    • Takuya Akashi
    • D24 - Medical and laboratory equipment

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210349116
    • Publication date Nov 11, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210239727
    • Publication date Aug 5, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Susumu SAKAIRI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210062553
    • Publication date Mar 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
  • Information Patent Application

    AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20210063422
    • Publication date Mar 4, 2021
    • Hitachi High-Technologies Corporation
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analysis Device
    • Publication number 20200241026
    • Publication date Jul 30, 2020
    • Hitachi High-Tech Corporation
    • Susumu SAKAIRI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20200209272
    • Publication date Jul 2, 2020
    • Hitachi High-Technologies Corporation
    • Takenori OKUSA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160161521
    • Publication date Jun 9, 2016
    • Hitachi High-Technologies Corporation
    • Susumu SAKAIRI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160124008
    • Publication date May 5, 2016
    • Roche Diagnostics Operations, Inc.
    • Reinhold Kraemer
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20160084827
    • Publication date Mar 24, 2016
    • Hitachi High-Technologies Corporation
    • Susumu SAKAIRI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20140271359
    • Publication date Sep 18, 2014
    • Hitachi High-Technologies Corporation
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20130089464
    • Publication date Apr 11, 2013
    • Yukinori SAKASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING DEVICE AND DEVICE FOR OPENING AND CLOSING COVER...
    • Publication number 20120328475
    • Publication date Dec 27, 2012
    • F. HOFFMAN-LA ROCHE AG
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20120301359
    • Publication date Nov 29, 2012
    • Reinhold Kraemer
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20110300021
    • Publication date Dec 8, 2011
    • Hitachi High-Technologies Corporation
    • Susumu Sakairi
    • G01 - MEASURING TESTING