TREA

Susumu Sugiyama

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  • Nagoya, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sensor
    • Patent number 6,338,199
    • Issue date Jan 15, 2002
    • Canon Kabushiki Kaisha
    • Tatsuo Chigira
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Capacitive sensing device
    • Patent number 5,291,534
    • Issue date Mar 1, 1994
    • Toyoda Koki Kabushiki Kaisha
    • Shizuki Sakurai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor pressure sensor
    • Patent number 5,163,329
    • Issue date Nov 17, 1992
    • Kabushiki Kaisha Toyota Chuo Kenkyusho
    • Keiichi Shimaoka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Static induction type semiconductor device
    • Patent number 4,994,870
    • Issue date Feb 19, 1991
    • Kabushiki Kaisha Toyoda Jidoshokki Seisakusho
    • Shinobu Aoki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor strain detector
    • Patent number 4,986,131
    • Issue date Jan 22, 1991
    • Kabushiki Kaisha Toyota Chuo Kenkyusho
    • Susumu Sugiyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Force transducer
    • Patent number 4,833,929
    • Issue date May 30, 1989
    • Kabushiki Kaisha Toyota Chuo Kenkyusho
    • Yoshiteru Omura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor pressure sensor
    • Patent number 4,771,638
    • Issue date Sep 20, 1988
    • Kabushiki Kaisha Toyota Chuo Kenkyusho
    • Susumu Sugiyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor pressure sensor and method of manufacturing the same
    • Patent number 4,766,666
    • Issue date Aug 30, 1988
    • Kabushiki Kaisha Toyota Chuo Kenkyusho
    • Susumu Sugiyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor apparatus
    • Patent number 4,672,417
    • Issue date Jun 9, 1987
    • Kabushiki Kaisha Toyota Chuo Kenkyusho and Narumi
    • Susumu Sugiyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Semiconductor strain measuring apparatus
    • Patent number 4,654,621
    • Issue date Mar 31, 1987
    • Kabushiki Kaisha Toyota Chuo Kenkyusho
    • Susumu Sugiyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor transducer
    • Patent number 4,576,052
    • Issue date Mar 18, 1986
    • Kabushiki Kaisha Toyota Chuo Kenkyusho
    • Susumu Sugiyama
    • G01 - MEASURING TESTING