Susumu Takagi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
System for measuring low current with contact making and breaking d...
- Patent number 5,929,626
- Issue date Jul 27, 1999
- Hewlett-Packard Company
- Yuko Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring voltage/current characteristics with means to...
- Patent number 5,754,041
- Issue date May 19, 1998
- Hewlett-Packard Company
- Noboru Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Contact making and breaking device and system for measuring low cur...
- Patent number 5,742,216
- Issue date Apr 21, 1998
- Hewlett-Packard Company
- Yuko Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring characteristics of circuit elements
- Patent number 4,701,701
- Issue date Oct 20, 1987
- Hewlett-Packard Company
- Susumu Takagi
- G01 - MEASURING TESTING