Sutapa Dutta

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Kolkata, IN

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Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION-BASED AUTOMATIC DEFECT CLASSIFICATION
- Publication number 20250117915
- Publication date Apr 10, 2025
- Applied Materials, Inc.
- Navneet Kumar Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIPLET AWARE ADAPTABLE QUANTIZATION
- Publication number 20240403258
- Publication date Dec 5, 2024
- Applied Materials, Inc.
- Bilal Shafi Sheikh
- G06 - COMPUTING CALCULATING COUNTING