SUYOUNG LEE

Person

Seongnam-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device including processing circuit for generating depth...
- Patent number 11,978,223
- Issue date May 7, 2024
- Samsung Electronics Co., Ltd.
- Soonyong Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus for inspecting semiconductor devices using cha...
- Patent number 11,754,517
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Suyoung Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing device for noise reduction using dual conversion g...
- Patent number 11,722,795
- Issue date Aug 8, 2023
- Samsung Electronics Co., Ltd.
- Daeyoung Kim
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Application processor, electronic device including the same and ope...
- Patent number 11,683,466
- Issue date Jun 20, 2023
- Samsung Electronics Co., Ltd.
- Daejung Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for stabilizing digital image, operating method thereof,...
- Patent number 11,611,708
- Issue date Mar 21, 2023
- Samsung Electronics Co., Ltd.
- Eunjik Yi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus for stabilizing digital image, operating method thereof,...
- Patent number 11,140,330
- Issue date Oct 5, 2021
- Samsung Electronics Co., Ltd.
- Eunjik Yi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems including a beam projection device providing variable expos...
- Patent number 10,115,562
- Issue date Oct 30, 2018
- Samsung Electronics Co., Ltd.
- Suyoung Lee
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INSPECTING DEFECTS
- Publication number 20250014169
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Bumjoo LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION METHOD
- Publication number 20240412943
- Publication date Dec 12, 2024
- Samsung Electronics Co., LTD
- Jinwoo Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RANDOM SAMPLING-BASED COLLECTIVE CLASSIFICATION METHOD AND SYSTEM F...
- Publication number 20240403389
- Publication date Dec 5, 2024
- Korea Advanced Institute of Science and Technology
- Sooel SON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240175915
- Publication date May 30, 2024
- Samsung Electronics Co., Ltd.
- SEKYE JEON
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20230266258
- Publication date Aug 24, 2023
- Samsung Electronics Co., Ltd.
- INHYE PARK
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR INSPECTION MET...
- Publication number 20230197402
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- YUJIN CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING DEVICE FOR NOISE REDUCTION USING DUAL CONVERSION G...
- Publication number 20220417457
- Publication date Dec 29, 2022
- Samsung Electronics Co., Ltd.
- Daeyoung KIM
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CAMERA MODULE AND IMAGING DEVICE INCLUDING THE SAME
- Publication number 20220360712
- Publication date Nov 10, 2022
- Samsung Electronics Co., Ltd.
- Jongwoo KIM
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ELECTRONIC DEVICE INCLUDING PROCESSING CIRCUIT FOR GENERATING DEPTH...
- Publication number 20220343523
- Publication date Oct 27, 2022
- Samsung Electronics Co., Ltd.
- Soonyong Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EVALUATING ROBUSTNESS OF ARTIFICIAL NEURAL NETWORK WATERM...
- Publication number 20220164417
- Publication date May 26, 2022
- Korea Advanced Institute of Science and Technology
- Sooel Son
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPLICATION PROCESSOR, ELECTRONIC DEVICE INCLUDING THE SAME AND OPE...
- Publication number 20220060674
- Publication date Feb 24, 2022
- Samsung Electronics Co., Ltd.
- Daejung KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR STABILIZING DIGITAL IMAGE, OPERATING METHOD THEREOF,...
- Publication number 20210360136
- Publication date Nov 18, 2021
- Samsung Electronics Co., Ltd.
- Eunjik YI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICES USING CHA...
- Publication number 20210333225
- Publication date Oct 28, 2021
- Samsung Electronics Co., Ltd.
- Suyoung Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR STABILIZING DIGITAL IMAGE, OPERATING METHOD THEREOF,...
- Publication number 20210266443
- Publication date Aug 26, 2021
- Samsung Electronics Co., Ltd.
- Eunjik YI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS INCLUDING A BEAM PROJECTION DEVICE PROVIDING VARIABLE EXPOS...
- Publication number 20170133199
- Publication date May 11, 2017
- Samsung Electronics Co., Ltd.
- SUYOUNG LEE
- H01 - BASIC ELECTRIC ELEMENTS

SUYOUNG LEE

Person

Patents Grantslast 30 patents

Electronic device including processing circuit for generating depth...

Inspection apparatus for inspecting semiconductor devices using cha...

Image processing device for noise reduction using dual conversion g...

Application processor, electronic device including the same and ope...

Apparatus for stabilizing digital image, operating method thereof,...

Apparatus for stabilizing digital image, operating method thereof,...

Systems including a beam projection device providing variable expos...

Patents Applicationslast 30 patents

METHOD OF INSPECTING DEFECTS

SUBSTRATE INSPECTION METHOD

RANDOM SAMPLING-BASED COLLECTIVE CLASSIFICATION METHOD AND SYSTEM F...

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

METHOD OF INSPECTING SEMICONDUCTOR DEVICE

SEMICONDUCTOR INSPECTION APPARATUS AND SEMICONDUCTOR INSPECTION MET...

IMAGE PROCESSING DEVICE FOR NOISE REDUCTION USING DUAL CONVERSION G...

CAMERA MODULE AND IMAGING DEVICE INCLUDING THE SAME

ELECTRONIC DEVICE INCLUDING PROCESSING CIRCUIT FOR GENERATING DEPTH...

METHOD OF EVALUATING ROBUSTNESS OF ARTIFICIAL NEURAL NETWORK WATERM...

APPLICATION PROCESSOR, ELECTRONIC DEVICE INCLUDING THE SAME AND OPE...

APPARATUS FOR STABILIZING DIGITAL IMAGE, OPERATING METHOD THEREOF,...

INSPECTION APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICES USING CHA...

APPARATUS FOR STABILIZING DIGITAL IMAGE, OPERATING METHOD THEREOF,...

SYSTEMS INCLUDING A BEAM PROJECTION DEVICE PROVIDING VARIABLE EXPOS...