Swarup Bhunia

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Midnapur, IN

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for determining memory device faults
- Patent number 7,548,473
- Issue date Jun 16, 2009
- Purdue Research Foundation
- Qikai Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Low power scan design and delay fault testing technique using first...
- Patent number 7,319,343
- Issue date Jan 15, 2008
- Purdue Research Foundation - Purdue University
- Swarup Bhunia
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and methods for determining memory device faults
- Publication number 20070242538
- Publication date Oct 18, 2007
- Qikai Chen
- G11 - INFORMATION STORAGE
Information Patent Application
Low power scan design and delay fault testing technique using first...
- Publication number 20060220679
- Publication date Oct 5, 2006
- Purdue Research Foundation-Purdue University
- Swarup Bhunia
- G01 - MEASURING TESTING