Swathi Gangasani

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus to implement a boundary scan for shared analo...
- Patent number 12,130,329
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Prasanth Viswanathan Pillai
- G01 - MEASURING TESTING
Information Patent Grant
Interruptible non-destructive run-time built-in self-test for field...
- Patent number 8,799,713
- Issue date Aug 5, 2014
- Texas Instruments Incorporated
- Swathi Gangasani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hybrid test compression architecture using multiple codecs for low...
- Patent number 8,527,821
- Issue date Sep 3, 2013
- Texas Instruments Incorporated
- Malav Shrikant Shah
- G01 - MEASURING TESTING
Information Patent Grant
On-chip seed generation using boolean functions for LFSR re-seeding...
- Patent number 8,286,042
- Issue date Oct 9, 2012
- Texas Instruments Incorporated
- Swathi Gangasani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS TO IMPLEMENT A BOUNDARY SCAN FOR SHARED ANALO...
- Publication number 20240288496
- Publication date Aug 29, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Prasanth Viswanathan Pillai
- G01 - MEASURING TESTING
Information Patent Application
HYBRID TEST COMPRESSION ARCHITECTURE USING MULTIPLE CODECS FOR LOW...
- Publication number 20120304031
- Publication date Nov 29, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Malav Shrikant Shah
- G01 - MEASURING TESTING
Information Patent Application
INTERRUPTIBLE NON-DESTRUCTIVE RUN-TIME BUILT-IN SELF-TEST FOR FIELD...
- Publication number 20120226942
- Publication date Sep 6, 2012
- Texas Instruments, Incorporated
- Swathi Gangasani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
On-Chip Seed Generation Using Boolean Functions for LFSR Re-Seeding...
- Publication number 20100218059
- Publication date Aug 26, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Swathi Gangasani
- G01 - MEASURING TESTING