Sybren Sijbrandij

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Wakefield, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle detecting device and charged particle beam system...
- Patent number 10,037,862
- Issue date Jul 31, 2018
- Carl Zeiss Microscopy, LLC
- Sybren J. Sijbrandij
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample inspection methods, systems and components
- Patent number 8,669,525
- Issue date Mar 11, 2014
- Carl Zeiss Microscopy, LLC
- Sybren Sijbrandij
- G01 - MEASURING TESTING
Information Patent Grant
Isotope ion microscope methods and systems
- Patent number 8,648,299
- Issue date Feb 11, 2014
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Isotope ion microscope methods and systems
- Patent number 8,399,834
- Issue date Mar 19, 2013
- Carl Zeiss NTS, LLC
- John Notte
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE DETECTING DEVICE AND CHARGED PARTICLE BEAM SYSTEM...
- Publication number 20170032925
- Publication date Feb 2, 2017
- Carl Zeiss Microscopy, LLC
- Sybren J. Sijbrandij
- G01 - MEASURING TESTING
Information Patent Application
ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
- Publication number 20130175444
- Publication date Jul 11, 2013
- CARL ZEISS NTS, LLC.
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
- Publication number 20110139979
- Publication date Jun 16, 2011
- CARL ZEISS NTS, LLC.
- John A. Notte, IV
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION METHODS, SYSTEMS AND COMPONENTS
- Publication number 20110121176
- Publication date May 26, 2011
- CARL ZEISS NTS, LLC.
- Sybren Sijbrandij
- G01 - MEASURING TESTING