Syed A. Obaidulla

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for an efficient memory built-in self test arc...
- Patent number 7,260,759
- Issue date Aug 21, 2007
- Sun Microsystems, Inc.
- Kamran Zarrineh
- G01 - MEASURING TESTING