Syed Shoaib Hasan Zaidi

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Poughkeepsie, NY, US

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Patents Applicationslast 30 patents

Information Patent Application
Optical measurement of device features using lenslet array illumina...
- Publication number 20050083514
- Publication date Apr 21, 2005
- Infineon Technologies North America Corp.
- Syed Shoaib Hasan Zaidi
- G01 - MEASURING TESTING
Information Patent Application
Optical measurement of planarized features
- Publication number 20030063272
- Publication date Apr 3, 2003
- Syed Shoaib Hasan Zaidi
- G01 - MEASURING TESTING