Syouzou Uchida

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor storage device, test method therefor, and test circui...
- Patent number 7,193,917
- Issue date Mar 20, 2007
- NEC Electronics Corporation
- Hiroyuki Takahashi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor storage device, test method therefor, and test circui...
- Publication number 20050207252
- Publication date Sep 22, 2005
- Hiroyuki Takahashi
- G11 - INFORMATION STORAGE