Syuichi Tsukada

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Yamanashi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Structure of probe card for inspecting electrical characteristics o...
- Patent number 8,723,544
- Issue date May 13, 2014
- Tokyo Electron Limited
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Grant
Probing apparatus and method for adjusting probing apparatus
- Patent number 8,063,652
- Issue date Nov 22, 2011
- Tokyo Electron Ltd.
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Probe device and method of regulating contact pressure between obje...
- Patent number 7,847,569
- Issue date Dec 7, 2010
- Tokyo Electron Limited
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for inspecting electric properties of an object
- Patent number 7,679,385
- Issue date Mar 16, 2010
- Tokyo Electron Limited
- Takashi Amemiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD
- Publication number 20110234251
- Publication date Sep 29, 2011
- TOKYO ELECTRON LIMITED
- Shigekazu Komatsu
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE AND METHOD OF REGULATING CONTACT PRESSURE BETWEEN OBJE...
- Publication number 20090284272
- Publication date Nov 19, 2009
- TOKYO ELECTRON LIMITED
- Toshihiro Yonezawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF POSITIONING AN ANISOTROPIC CONDUCTIVE CONNECTOR, METHOD O...
- Publication number 20090015281
- Publication date Jan 15, 2009
- JSR Corporation
- Mutsuhiko Yoshioka
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Probe Card
- Publication number 20080048698
- Publication date Feb 28, 2008
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20080007280
- Publication date Jan 10, 2008
- Takashi Amemiya
- G01 - MEASURING TESTING
Information Patent Application
Probing apparatus and method for adjusting probing apparatus
- Publication number 20070108996
- Publication date May 17, 2007
- Takashi Amemiya
- G01 - MEASURING TESTING