Syuichi Ueno

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Chiyoda-ku, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device including impurity layer having continuous por...
- Patent number 6,841,440
- Issue date Jan 11, 2005
- Renesas Technology Corp.
- Takashi Kuroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including impurity layer having continuous por...
- Patent number 6,541,825
- Issue date Apr 1, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takashi Kuroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method and semiconductor device
- Patent number 6,387,743
- Issue date May 14, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Katsuomi Shiozawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method and semiconductor device
- Patent number 6,333,540
- Issue date Dec 25, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Katsuomi Shiozawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device including impurity layer having continuous por...
- Publication number 20030143810
- Publication date Jul 31, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Takashi Kuroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20020038901
- Publication date Apr 4, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Takashi Kuroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SEMICONDUCTOR DEVICE
- Publication number 20020024095
- Publication date Feb 28, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Katsuomi Shiozawa
- H01 - BASIC ELECTRIC ELEMENTS