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Gowarzewo, PL
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Patents Grants
last 30 patents
Information
Patent Grant
Suspect resolution for scan chain defect diagnosis
Patent number
11,423,202
Issue date
Aug 23, 2022
SIEMENS INDUSTRY SOFTWARE INC.
Grzegorz Mrugalski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Reversible multi-bit scan cell-based scan chains for improving chai...
Patent number
11,156,661
Issue date
Oct 26, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Diagnostic resolution enhancement with reversible scan chains
Patent number
11,106,848
Issue date
Aug 31, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optimized scan chain diagnostic pattern generation for reversible s...
Patent number
11,041,906
Issue date
Jun 22, 2021
SIEMENS INDUSTRY SOFTWARE INC.
Yu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Non-adaptive pattern reordering to improve scan chain diagnostic re...
Patent number
10,796,043
Issue date
Oct 6, 2020
Mentor Graphics Corporation
Yu Huang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inter-cell bridge defect diagnosis
Patent number
10,657,207
Issue date
May 19, 2020
Mentor Graphics Corporation
Huaxing Tang
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SUSPECT RESOLUTION FOR SCAN CHAIN DEFECT DIAGNOSIS
Publication number
20220065932
Publication date
Mar 3, 2022
Mentor Graphics Corporation
Grzegorz Mrugalski
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSTIC RESOLUTION ENHANCEMENT WITH REVERSIBLE SCAN CHAINS
Publication number
20210150111
Publication date
May 20, 2021
Mentor Graphics Corporation
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Application
Reversible Multi-Bit Scan Cell-based Scan Chains For Improving Chai...
Publication number
20210033669
Publication date
Feb 4, 2021
Mentor Graphics Corporation
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Application
Optimized Scan Chain Diagnostic Pattern Generation for Reversible S...
Publication number
20200333398
Publication date
Oct 22, 2020
Mentor Graphics Corporation
Yu Huang
G01 - MEASURING TESTING