Szu Huat GOH

Person

Singapore, SG

People

Patents Grantslast 30 patents

Information Patent Grant
Defect localization in embedded memory
- Patent number 11,639,959
- Issue date May 2, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat (Wu Shifa) Goh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor chip, method of fabricating thereof, and method of te...
- Patent number 11,631,470
- Issue date Apr 18, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat Goh
- G11 - INFORMATION STORAGE
Information Patent Grant
Defect localization in embedded memory
- Patent number 10,962,592
- Issue date Mar 30, 2021
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat (Wu Shifa) Goh
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for design of RF integrated circuits for process...
- Patent number 10,817,644
- Issue date Oct 27, 2020
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Varun Gupta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for fabricating electronic devices including substantially...
- Patent number 10,336,608
- Issue date Jul 2, 2019
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat Goh
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Defect isolation methods and systems
- Patent number 9,958,502
- Issue date May 1, 2018
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat Goh
- G01 - MEASURING TESTING
Information Patent Grant
Defect isolation methods and systems
- Patent number 9,739,831
- Issue date Aug 22, 2017
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat Goh
- G01 - MEASURING TESTING
Information Patent Grant
Electronic devices including substantially hermetically sealed cavi...
- Patent number 9,718,672
- Issue date Aug 1, 2017
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat Goh
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR CHIP, METHOD OF FABRICATING THEREOF, AND METHOD OF TE...
- Publication number 20230030630
- Publication date Feb 2, 2023
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat GOH
- G11 - INFORMATION STORAGE
Information Patent Application
DEFECT LOCALIZATION IN EMBEDDED MEMORY
- Publication number 20210199715
- Publication date Jul 1, 2021
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat (Wu Shifa) GOH
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT AND METHOD FOR DESIGN OF RF INTEGRATED CIRCUITS FOR PROCESS...
- Publication number 20200125694
- Publication date Apr 23, 2020
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Varun GUPTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT LOCALIZATION IN EMBEDDED MEMORY
- Publication number 20200081061
- Publication date Mar 12, 2020
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat (Wu Shifa) GOH
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING AND OPTIMIZING TIMING SPECIFICATIONS FOR AN...
- Publication number 20200065183
- Publication date Feb 27, 2020
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Yin Hong CHAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR FABRICATING ELECTRONIC DEVICES INCLUDING SUBSTANTIALLY...
- Publication number 20170291813
- Publication date Oct 12, 2017
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat Goh
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ELECTRONIC DEVICES INCLUDING SUBSTANTIALLY HERMETICALLY SEALED CAVI...
- Publication number 20160347608
- Publication date Dec 1, 2016
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat Goh
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
DEFECT ISOLATION METHODS AND SYSTEMS
- Publication number 20160161556
- Publication date Jun 9, 2016
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat GOH
- G01 - MEASURING TESTING
Information Patent Application
DEFECT ISOLATION METHODS AND SYSTEMS
- Publication number 20160047858
- Publication date Feb 18, 2016
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Szu Huat GOH
- G01 - MEASURING TESTING

Szu Huat GOH

Person

Patents Grantslast 30 patents

Defect localization in embedded memory

Semiconductor chip, method of fabricating thereof, and method of te...

Defect localization in embedded memory

Circuit and method for design of RF integrated circuits for process...

Methods for fabricating electronic devices including substantially...

Defect isolation methods and systems

Defect isolation methods and systems

Electronic devices including substantially hermetically sealed cavi...

Patents Applicationslast 30 patents

SEMICONDUCTOR CHIP, METHOD OF FABRICATING THEREOF, AND METHOD OF TE...

DEFECT LOCALIZATION IN EMBEDDED MEMORY

CIRCUIT AND METHOD FOR DESIGN OF RF INTEGRATED CIRCUITS FOR PROCESS...

DEFECT LOCALIZATION IN EMBEDDED MEMORY

METHOD FOR DETERMINING AND OPTIMIZING TIMING SPECIFICATIONS FOR AN...

METHODS FOR FABRICATING ELECTRONIC DEVICES INCLUDING SUBSTANTIALLY...

ELECTRONIC DEVICES INCLUDING SUBSTANTIALLY HERMETICALLY SEALED CAVI...

DEFECT ISOLATION METHODS AND SYSTEMS

DEFECT ISOLATION METHODS AND SYSTEMS