Szu-Hung Yang

Person

Tainan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device structure with gate stack and method for formi...
- Patent number 12,261,203
- Issue date Mar 25, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Chih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plating apparatus and method for electroplating wafer
- Patent number 12,227,865
- Issue date Feb 18, 2025
- Taiwan Semiconductor Manufacturing Company Limited
- Che-Min Lin
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Semiconductor structure
- Patent number 12,218,227
- Issue date Feb 4, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Hao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method
- Patent number 12,142,668
- Issue date Nov 12, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Chih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with tunable epitaxy structures and method of...
- Patent number 12,112,989
- Issue date Oct 8, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Hao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-gate device fabrication and structures thereof
- Patent number 11,996,468
- Issue date May 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Chih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanisms for growing epitaxy structure of finFET device
- Patent number 11,949,015
- Issue date Apr 2, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Szu-Chi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and method for manufacturing the same
- Patent number 11,742,416
- Issue date Aug 29, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Hao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interface trap charge density reduction
- Patent number 11,670,551
- Issue date Jun 6, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Szu-Chi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with tunable epitaxy structures and method of...
- Patent number 11,581,226
- Issue date Feb 14, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Hao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanisms for growing epitaxy structure of finFET device
- Patent number 11,437,516
- Issue date Sep 6, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Szu-Chi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plating apparatus and method for electroplating wafer
- Patent number 11,401,624
- Issue date Aug 2, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Che-Min Lin
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Semiconductor device and method
- Patent number 11,217,679
- Issue date Jan 4, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Chih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS image sensor structure with crosstalk improvement
- Patent number 10,957,728
- Issue date Mar 23, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hung-Chang Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS image sensor structure with crosstalk improvement
- Patent number 10,367,019
- Issue date Jul 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Hung-Chang Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and method of forming the same
- Patent number 9,515,021
- Issue date Dec 6, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Chih Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for achieving width control in etching processes
- Patent number 9,040,317
- Issue date May 26, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keng-Ying Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual profile shallow trench isolation apparatus and system
- Patent number 8,872,301
- Issue date Oct 28, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Yang Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structures for grounding metal shields in backside illumination ima...
- Patent number 8,803,271
- Issue date Aug 12, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Zhe-Ju Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma etch method for forming uniform linewidth residue free patte...
- Patent number 6,686,292
- Issue date Feb 3, 2004
- Taiwan Semiconductor Manufacturing Company
- Szu-Hung Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming corrosion inhibited conductor layer
- Patent number 6,682,659
- Issue date Jan 27, 2004
- Taiwan Semiconductor Manufacturing Company
- Ching-Wen Cho
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20250133761
- Publication date Apr 24, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Hao LIN
Information Patent Application
SEMICONDUCTOR DEVICE WITH TUNABLE EPITAXY STRUCTURES AND METHOD OF...
- Publication number 20240413018
- Publication date Dec 12, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Hao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH GATE STACK
- Publication number 20240395860
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Chih LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD
- Publication number 20240395902
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chien-Chih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE TRAP CHARGE DENSITY REDUCTION
- Publication number 20240387274
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Szu-Chi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-GATE DEVICE FABRICATION AND STRUCTURES THEREOF
- Publication number 20240313090
- Publication date Sep 19, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Chih LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MECHANISMS FOR GROWING EPITAXY STRUCTURE OF FINFET DEVICE
- Publication number 20240250174
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Szu-Chi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH INDUCTIVE COMPONENT AND METHOD OF FORMING
- Publication number 20240234481
- Publication date Jul 11, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Szu-Shu Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20230395703
- Publication date Dec 7, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Hao LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE TRAP CHARGE DENSITY REDUCTION
- Publication number 20230326802
- Publication date Oct 12, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Szu-Chi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE STRUCTURE WITH GATE STACK AND METHOD FOR FORMI...
- Publication number 20230122339
- Publication date Apr 20, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Chih LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220384609
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Hao LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MECHANISMS FOR GROWING EPITAXY STRUCTURE OF FINFET DEVICE
- Publication number 20220384655
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Szu-Chi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLATING APPARATUS AND METHOD FOR ELECTROPLATING WAFER
- Publication number 20220356594
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Che-Min Lin
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Semiconductor Device With Tunable Epitaxy Structures And Method Of...
- Publication number 20220359308
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Hao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-GATE DEVICE FABRICATION AND STRUCTURES THEREOF
- Publication number 20220336639
- Publication date Oct 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Chih LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method
- Publication number 20220123126
- Publication date Apr 21, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Chih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLATING APPARATUS AND METHOD FOR ELECTROPLATING WAFER
- Publication number 20220025540
- Publication date Jan 27, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Che-Min Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method
- Publication number 20210313441
- Publication date Oct 7, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Chih Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Interface Trap Charge Density Reduction
- Publication number 20210098305
- Publication date Apr 1, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Szu-Chi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device With Tunable Epitaxy Structures And Method Of...
- Publication number 20210098311
- Publication date Apr 1, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Shih-Hao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS IMAGE SENSOR STRUCTURE WITH CROSSTALK IMPROVEMENT
- Publication number 20190127036
- Publication date May 2, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hung-Chang CHANG
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
MECHANISMS FOR GROWING EPITAXY STRUCTURE OF FINFET DEVICE
- Publication number 20180151737
- Publication date May 31, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Szu-Chi Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMOS IMAGE SENSOR STRUCTURE WITH CROSSTALK IMPROVEMENT
- Publication number 20160225810
- Publication date Aug 4, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hung-Chang CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual Profile Shallow Trench Isolation Apparatus and System
- Publication number 20130277790
- Publication date Oct 24, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Yang Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for Achieving Width Control in Etching Processes
- Publication number 20130252355
- Publication date Sep 26, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keng-Ying Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structures for Grounding Metal Shields in Backside Illumination Ima...
- Publication number 20130249040
- Publication date Sep 26, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Zhe-Ju Liu
- H01 - BASIC ELECTRIC ELEMENTS

Szu-Hung Yang

Person

Patents Grantslast 30 patents

Semiconductor device structure with gate stack and method for formi...

Plating apparatus and method for electroplating wafer

Semiconductor structure

Semiconductor device and method

Semiconductor device with tunable epitaxy structures and method of...

Multi-gate device fabrication and structures thereof

Mechanisms for growing epitaxy structure of finFET device

Semiconductor structure and method for manufacturing the same

Interface trap charge density reduction

Semiconductor device with tunable epitaxy structures and method of...

Mechanisms for growing epitaxy structure of finFET device

Plating apparatus and method for electroplating wafer

Semiconductor device and method

CMOS image sensor structure with crosstalk improvement

CMOS image sensor structure with crosstalk improvement

Semiconductor structure and method of forming the same

Methods for achieving width control in etching processes

Dual profile shallow trench isolation apparatus and system

Structures for grounding metal shields in backside illumination ima...

Plasma etch method for forming uniform linewidth residue free patte...

Method for forming corrosion inhibited conductor layer

Patents Applicationslast 30 patents

SEMICONDUCTOR STRUCTURE

SEMICONDUCTOR DEVICE WITH TUNABLE EPITAXY STRUCTURES AND METHOD OF...

SEMICONDUCTOR DEVICE STRUCTURE WITH GATE STACK

SEMICONDUCTOR DEVICE AND METHOD

INTERFACE TRAP CHARGE DENSITY REDUCTION

MULTI-GATE DEVICE FABRICATION AND STRUCTURES THEREOF

MECHANISMS FOR GROWING EPITAXY STRUCTURE OF FINFET DEVICE

SEMICONDUCTOR DEVICE WITH INDUCTIVE COMPONENT AND METHOD OF FORMING

SEMICONDUCTOR STRUCTURE

INTERFACE TRAP CHARGE DENSITY REDUCTION

SEMICONDUCTOR DEVICE STRUCTURE WITH GATE STACK AND METHOD FOR FORMI...

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

MECHANISMS FOR GROWING EPITAXY STRUCTURE OF FINFET DEVICE

PLATING APPARATUS AND METHOD FOR ELECTROPLATING WAFER

Semiconductor Device With Tunable Epitaxy Structures And Method Of...

MULTI-GATE DEVICE FABRICATION AND STRUCTURES THEREOF

Semiconductor Device and Method

PLATING APPARATUS AND METHOD FOR ELECTROPLATING WAFER

Semiconductor Device and Method

Interface Trap Charge Density Reduction

Semiconductor Device With Tunable Epitaxy Structures And Method Of...

CMOS IMAGE SENSOR STRUCTURE WITH CROSSTALK IMPROVEMENT

MECHANISMS FOR GROWING EPITAXY STRUCTURE OF FINFET DEVICE

CMOS IMAGE SENSOR STRUCTURE WITH CROSSTALK IMPROVEMENT

Dual Profile Shallow Trench Isolation Apparatus and System

Methods for Achieving Width Control in Etching Processes

Structures for Grounding Metal Shields in Backside Illumination Ima...