T. Dean Skelton

Person

  • San Jose, CA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Module level scan testing

    • Patent number 6,079,040
    • Issue date Jun 20, 2000
    • Chips & Technologies, Inc.
    • Pat Y. Hom
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method and apparatus for clipping text

    • Patent number 6,061,047
    • Issue date May 9, 2000
    • Chips & Technologies, Inc.
    • T. Dean Skelton
    • G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS