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T. Dean Skelton
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San Jose, CA, US
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last 30 patents
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Patent Grant
Module level scan testing
Patent number
6,079,040
Issue date
Jun 20, 2000
Chips & Technologies, Inc.
Pat Y. Hom
G01 - MEASURING TESTING
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Patent Grant
Method and apparatus for clipping text
Patent number
6,061,047
Issue date
May 9, 2000
Chips & Technologies, Inc.
T. Dean Skelton
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS