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Ta-Wen Hung
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Wugu Township, TW
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last 30 patents
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Patent Grant
RC delay detectors with high sensitivity for through substrate vias
Patent number
8,384,430
Issue date
Feb 26, 2013
Taiwan Semiconductor Manufacturing Company, Ltd.
Nan-Hsin Tseng
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
RC Delay Detectors with High Sensitivity for Through Substrate Vias
Publication number
20120038388
Publication date
Feb 16, 2012
Taiwan Semiconductor Manufacturing Company, Ltd.
Nan-Hsin Tseng
H03 - BASIC ELECTRONIC CIRCUITRY