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Givat Shimshit, IL
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last 30 patents
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Patent Grant
Calibration of X-ray reflectometry system
Patent number
7,474,732
Issue date
Jan 6, 2009
Jordan Valley Applied Radiation Ltd.
David Berman
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Calibration of X-ray reflectometry system
Publication number
20060115046
Publication date
Jun 1, 2006
David Berman
G01 - MEASURING TESTING