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Tadahisa Hoshino
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Surveying instrument having an optical distance meter and an autofo...
Patent number
6,891,141
Issue date
May 10, 2005
PENTAX Corporation
Kenji Kaneko
G01 - MEASURING TESTING
Information
Patent Grant
Surveying instrument having an optical distance meter and an autofo...
Patent number
6,734,410
Issue date
May 11, 2004
Pentax Precision Co., Ltd.
Kenji Kaneko
G01 - MEASURING TESTING
Information
Patent Grant
Surveying instrument, surveying instrument having AF function, surv...
Patent number
6,624,402
Issue date
Sep 23, 2003
Pentax Precision Co., Ltd.
Kenji Kaneko
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Surveying instrument having an optical distance meter and an autofo...
Publication number
20040246462
Publication date
Dec 9, 2004
PENTAX PRECISION CO., LTD.
Kenji Kaneko
G02 - OPTICS
Information
Patent Application
Surveying instrument having an optical distance meter and an autofo...
Publication number
20040178322
Publication date
Sep 16, 2004
PENTAX PRECISION CO., LTD.
Kenji Kaneko
G02 - OPTICS
Information
Patent Application
surveying instrument having an optical distance meter and an autofo...
Publication number
20020040959
Publication date
Apr 11, 2002
ASAHI SEIMITSU KABUSHIKI KAISHA Tokyo, JAPAN
Kenji Kaneko
G01 - MEASURING TESTING
Information
Patent Application
Surveying intstrument, surveying instrument having AF function, sur...
Publication number
20010039740
Publication date
Nov 15, 2001
ASAHI SEIMITSU KABUSHIKI KAISHA
Kenji Kaneko
G01 - MEASURING TESTING