Tadanori Nishikobara

Follow

Person

Atsugi-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement parameter input control device and measurement paramete...
- Patent number 8,442,662
- Issue date May 14, 2013
- Anritsu Corporation
- Yohei Niki
- G01 - MEASURING TESTING
Information Patent Grant
Data signal quality evaluation apparatus
- Patent number 8,391,346
- Issue date Mar 5, 2013
- Anritsu Corporation
- Keita Masuhara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Jitter generation apparatus, device test system using the same, and...
- Patent number 8,143,959
- Issue date Mar 27, 2012
- Anritsu Corporation
- Katsuyuki Yaginuma
- G01 - MEASURING TESTING
Information Patent Grant
Time interval measuring apparatus and jitter measuring apparatus us...
- Patent number 7,574,311
- Issue date Aug 11, 2009
- Anritsu Corporation
- Ken Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and measuring method for pattern dependent jitter
- Patent number 7,010,444
- Issue date Mar 7, 2006
- Anritsu Corporation
- Tadanori Nishikobara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
DATA SIGNAL QUALITY EVALUATION APPARATUS
- Publication number 20110268170
- Publication date Nov 3, 2011
- Anritsu Corporation
- Keita Masuhara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT PARAMETER INPUT CONTROL DEVICE AND MEASUREMENT PARAMETE...
- Publication number 20110196515
- Publication date Aug 11, 2011
- Anritsu Corporation
- Yohei Niki
- G01 - MEASURING TESTING
Information Patent Application
WINDOW DISPLAY CONTROL APPARATUS AND METHOD OF CONTROLLING WINDOW D...
- Publication number 20110119622
- Publication date May 19, 2011
- Anritsu Corporation
- Yohei Niki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
JITTER GENERATION APPARATUS, DEVICE TEST SYSTEM USING THE SAME, AND...
- Publication number 20100150218
- Publication date Jun 17, 2010
- Anritsu Corporation
- Katsuyuki Yaginuma
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Time Interval Measuring Apparatus and Jitter Measuring Apparatus Us...
- Publication number 20080172194
- Publication date Jul 17, 2008
- Anritsu Corporation
- Ken Mochizuki
- G04 - HOROLOGY
Information Patent Application
Measuring apparatus and measuring method for pattern dependent jitter
- Publication number 20040143406
- Publication date Jul 22, 2004
- Anritsu Corporation
- Tadanori Nishikobara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE