Tadanori Takahashi

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and scanning electron microscope for measuring width of mate...
- Patent number 7,385,196
- Issue date Jun 10, 2008
- Hitachi High-Technologies Corporation
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and scanning electron microscope for measuring dimension of...
- Patent number 6,791,084
- Issue date Sep 14, 2004
- Hitachi High-Technologies Corporation
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resolving power evaluation method and specimen for electron microscope
- Patent number 6,166,380
- Issue date Dec 26, 2000
- Hitachi, Ltd.
- Taiji Kitagawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and scanning electron microscope for measuring width of mate...
- Publication number 20050006581
- Publication date Jan 13, 2005
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and scanning electron microscope for measuring width of mate...
- Publication number 20030071214
- Publication date Apr 17, 2003
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS