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Tadashi ARII
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Stamp-face platemaking device, medium holder, and medium holder man...
Patent number
9,744,788
Issue date
Aug 29, 2017
Casio Computer Co., Ltd.
Hirotaka Yuno
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Method for analysis of sample and apparatus therefor
Patent number
9,691,594
Issue date
Jun 27, 2017
Rigaku Corporation
Tadashi Arii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ionizing device
Patent number
8,592,779
Issue date
Nov 26, 2013
Hamamatsu Photonics K.K.
Shigeki Matsuura
G01 - MEASURING TESTING
Information
Patent Grant
Gas analyzer
Patent number
8,044,343
Issue date
Oct 25, 2011
Rigaku Corporation
Tadashi Arii
G01 - MEASURING TESTING
Information
Patent Grant
Gas analyzing method and gas analyzing apparatus
Patent number
7,989,761
Issue date
Aug 2, 2011
Rigaku Corporation
Tadashi Arii
G01 - MEASURING TESTING
Information
Patent Grant
Temperature-programmed desorbed gas analyzing apparatus
Patent number
7,155,960
Issue date
Jan 2, 2007
Rigaku Corporation
Tadashi Arii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Evolved gas analyzing method and apparatus
Patent number
7,140,231
Issue date
Nov 28, 2006
Rigaku Corporation
Tadashi Arii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR ANALYSIS OF SAMPLE AND APPARATUS THEREFOR
Publication number
20160189944
Publication date
Jun 30, 2016
Rigaku Corporation
Tadashi Arii
G01 - MEASURING TESTING
Information
Patent Application
STAMP-FACE PLATEMAKING DEVICE, MEDIUM HOLDER, AND MEDIUM HOLDER MAN...
Publication number
20150084257
Publication date
Mar 26, 2015
CASIO COMPUTER CO., LTD.
Hirotaka YUNO
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Application
GAS ANALYZING METHOD AND GAS ANALYZING APPARATUS
Publication number
20090173879
Publication date
Jul 9, 2009
Rigaku Corporation
Tadashi ARII
G01 - MEASURING TESTING
Information
Patent Application
GAS ANALYZER
Publication number
20090026362
Publication date
Jan 29, 2009
Rigaku Corporation
Tadashi Arii
G01 - MEASURING TESTING
Information
Patent Application
Ionizing Device
Publication number
20090008571
Publication date
Jan 8, 2009
Shigeki Matsuura
G01 - MEASURING TESTING
Information
Patent Application
Evolved gas analyzing method and apparatus
Publication number
20050112027
Publication date
May 26, 2005
Tadashi Arii
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for producing metal oxide
Publication number
20050098112
Publication date
May 12, 2005
Rigaku Corporation
Tadashi Arii
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Temperature-programmed desorbed gas analyzing apparatus
Publication number
20050086997
Publication date
Apr 28, 2005
Rigaku Corporation
Tadashi Arii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for producing metal oxide
Publication number
20030087516
Publication date
May 8, 2003
Rigaku Corporation
Tadashi Arii
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL