Tadashi Kainuma

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Conveyor device, electronic device handling apparatus and conveying...
- Patent number 7,471,077
- Issue date Dec 30, 2008
- Advantest Corporation
- Kenichi Shimada
- G01 - MEASURING TESTING
Information Patent Grant
IC testing apparatus
- Patent number 6,257,319
- Issue date Jul 10, 2001
- Advantest Corporation
- Tadashi Kainuma
- G01 - MEASURING TESTING
Information Patent Grant
Automatic testing system and method for semiconductor devices
- Patent number 5,788,084
- Issue date Aug 4, 1998
- Advantest Corporation
- Takeshi Onishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Conveyor device, electronic device handling apparatus and conveying...
- Publication number 20060119347
- Publication date Jun 8, 2006
- Advantest Corporation
- Kenichi Shimada
- G01 - MEASURING TESTING